Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 1645 2800 2855 2877
This examiner grants 86% of resolved cases
Tri T. Ton is an examiner in Art Unit 1645 of Tech Center 2800. He has a volume of 1199 resolved cases. The allowance rate is 86.1 percent, which indicates a favorable environment for patent applicants. This 86.1 percent rate provides a benchmark for the probability of success for applications reaching a final resolution.
The interview lift is 10.5 percent. This 10.5 percent lift suggests that interviews are a productive way to advance prosecution and increase the likelihood of an allowance. Practitioners should consider this lift when deciding whether to engage in a formal discussion to resolve outstanding issues and improve upon the 86.1 percent baseline for the 1199 resolved cases.
The median days to allowance is 762. This 762-day duration is the timeline for reaching a grant. For the applications handled by Ton, the combination of an 86.1 percent allowance rate and a 762-day median suggests an efficient prosecution process for applications assigned to Tech Center 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18643002 | UTILITY POLE DETERIORATION DETECTION SYSTEM, UTILITY POLE DETERIORATION DETECTION APPARATUS, UTILITY POLE DETERIORATION DETECTION METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM | Non-Final OA | NEC Corporation |
| 18910356 | SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD | Non-Final OA | Samsung Display Co., LTD. |
| 19351429 | NOVEL TECHNIQUES FOR EXAMINATION OF LIGHT OPTICAL ELEMENTS | Final Rejection | Lumus Ltd. |
| 18514512 | OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM STORING OPTICAL INSPECTION PROGRAM | Final Rejection | KABUSHIKI KAISHA TOSHIBA |
| 17993250 | Method and apparatus for measuring objects | Non-Final OA | SICK AG |
| 19073640 | P-TYPE SILICON WAFER SCATTERING SUBSTRATE | Non-Final OA | KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS |
| 18962220 | METHOD FOR INSPECTING PATTERN DEFECTS | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18792873 | SURFACE INSPECTION TOOL FOR TRANSFER TOOLS AND METHODS OF USING THE SAME | Final Rejection | Taiwan Semiconductor Manufacturing Company Limited |
| 18511021 | SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION | Non-Final OA | APPLIED MATERIALS, INC. |
| 19098645 | GATE/POPULATION NAMING IN FLOW CYTOMETRY DATA ANALYSIS BASED ON GEOMETRY AND DATA DISTRIBUTION | Non-Final OA | Becton, Dickinson and Company |
| 18805013 | Droplet Sorting Decision Modules, Systems and Methods of Use Thereof | Final Rejection | Becton, Dickinson and Company |
| 18626571 | INSPECTING EQUIPMENT AND METHOD THEREOF | Final Rejection | NANYA TECHNOLOGY CORPORATION |
| 19075745 | SURFACE ROUGHNESS CALCULATION DEVICE | Non-Final OA | SUMITOMO HEAVY INDUSTRIES, LTD. |
| 18385909 | METHOD FOR MONITORING PERFORMANCE OF ECCENTRICITY CORRECTION UNIT AND SUBSTRATE TREATING APPARATUS FOR PERFORMING METHOD | Final Rejection | SEMES CO., LTD. |
| 18289693 | METHOD AND SYSTEM FOR DETERMINING MAGNETIC BEAD CONCENTRATION IN SUSPENSION | Final Rejection | SEEGENE, INC. |
| 18457309 | BRAIN NATRIURETIC PEPTIDE APTAMER FLUORESCENCE DETECTION DEVICE BASED ON SMART PHONE AND SENSING METHOD OF SAME | Non-Final OA | TianJin University |
| 18832176 | MEASUREMENT DEVICE AND MEASUREMENT METHOD | Non-Final OA | RISE Research Institutes of Sweden AB |
| 18686743 | OPTICAL SYSTEM FOR SHAPE MEASURING DEVICE | Non-Final OA | KOBELCO RESEARCH INSTITUTE, INC. |
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