Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 1744 2858 2868
This examiner grants 74% of resolved cases
Steven Lee Yeninas serves in Tech Center 2800 and Art Unit 1744. The examiner has completed 486 resolved cases. These resolutions have led to an allowance rate of 73.5 percent. This rate indicates the frequency of successful outcomes for applications assigned to this examiner.
The median days to allowance for these cases is 944. This timeframe suggests the pace of the prosecution process for successful applications. The interview lift is 5.4 percent. This figure shows that interviews are associated with an increase in the probability of allowance compared to the 73.5 percent baseline.
For those with applications in Art Unit 1744, the 73.5 percent allowance rate is a key indicator. The 944 days to allowance provides a baseline for planning the prosecution timeline. With 486 resolved cases, the examiner has demonstrated a consistent pattern of resolution within Tech Center 2800. The 5.4 percent interview lift reflects the impact of direct communication.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18987180 | TEST DEVICE, TEST SYSTEM AND OPERATING METHOD OF TEST DEVICE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18938245 | OPERATION TERMINAL, METHOD FOR OPERATING OPERATION TERMINAL, AND MAGNETIC RESONANCE IMAGING SYSTEM | Final Rejection | FUJIFILM Corporation |
| 18999231 | INSPECTION DEVICE, INSPECTION METHOD, AND METHOD FOR MANUFACTURING BATTERY | Non-Final OA | KABUSHIKI KAISHA TOSHIBA |
| 18898056 | RECONFIGURABLE PROBE CARD FOR CRYOGENIC APPLICATIONS | Non-Final OA | International Business Machines Corporation |
| 19079668 | MEASUREMENT APPARATUS AND MEASUREMENT METHOD | Non-Final OA | Yokogawa Electric Corporation |
| 18588231 | SELF-CALIBRATING ANGLE SENSOR | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 18746712 | OPTICAL COMPONENT WITH CONDUCTIVE TRACE, ASSOCIATED OPTICAL MODULE, AND ASSOCIATED METHOD | Non-Final OA | STMICROELECTRONICS INTERNATIONAL N.V. |
| 19074933 | PROBE HOLDER AND INSPECTION METHOD | Non-Final OA | NHK Spring Co., Ltd. |
| 18413114 | INDUCTIVE SENSOR DEVICE WITH INDUCTOR COIL FORMED IN REDISTRIBUTION LAYER (RDL) REGION | Final Rejection | Microchip Technology Incorporated |
| 19022561 | APPARATUS FOR DETECTING DISCONNECTION OF MOTOR | Non-Final OA | Hanon Systems |
| 18943157 | ELECTRICAL STRESS DETECTION CIRCUITRY FOR A SEMICONDUCTOR PACKAGE | Non-Final OA | Sandisk Technologies, Inc. |
| 18880396 | MAGNETIC DETECTOR | Non-Final OA | AICHI STEEL CORPORATION |
| 18954353 | INDUCTIVE ANGULAR POSITION SENSOR | Non-Final OA | SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC |
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