Technology area: Semiconductors, Circuits & Optics
10 pending office actions • 2 clients • 10 examiners • 6 art units • 0 of 10 (0%) have an AI response strategy ready • 2 patents granted in the last 365 days
Spano Law Group (KLA) has 10 pending office actions in Semiconductors, Circuits & Optics and 219 career applications. The profile connects an active response docket with a broader record of applications in the same technology area.
The resolved allowance rate is 99.47%, and the average is 2.59 office actions per allowance. The allowance figure describes resolved outcomes, while the action average indicates the recorded examination effort associated with matters reaching allowance.
For practitioners, the combination provides a useful starting point for evaluating current capacity and historical prosecution results. It does not show why individual matters were allowed, how claims changed, or whether the pending actions involve the same clients or technologies represented in the application record.
Based on the USPTO statutory response window for each pending office action. 2 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 only | 2 (20%) |
| §101 + other | 1 (10%) |
| §103 only | 3 (30%) |
| §102 only | 1 (10%) |
| Multi-statute (no §101) | 3 (30%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| THOMAS, COURTNEY D | 1 | 89.0% | +9.4% |
| TRAN, JUDY DAO | 1 | 80.0% | +16.5% |
| HANSEN, JONATHAN M | 1 | 79.4% | +11.5% |
| MENDOZA, ALEXANDRIA ARELLANO | 1 | 68.8% | +28.0% |
| QUIGLEY, KYLE ROBERT | 1 | 53.3% | +34.2% |
| LU, ZHIYU | 1 | 48.8% | +14.4% |
| FABIAN JR, ROBERTO | 1 | 71.0% | +28.5% |
| GAVIA, NYLA EMANI ANN | 1 | 77.9% | +17.9% |
| ERDMAN, CHAD G | 1 | 80.2% | +17.7% |
| JEFFERSON, QUOVAUNDA | 1 | 79.4% | +8.7% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 19050479 | High Brightness X-Ray Source For Semiconductor Metrology | THOMAS, COURTNEY D | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 6 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18387015 | Methods And Systems For Measurement Of Semiconductor Structures With Active Tilt Correction | FABIAN JR, ROBERTO | 1d overdue |
| 18229606 | Methods And Systems For Systematic Error Compensation Across A Fleet Of Metrology Systems Based On A Trained Error Evaluation Model | GAVIA, NYLA EMANI ANN | 35d |
| 18977795 | Methods And Systems For Reflectometry Based Measurements Of Deep, Large Pitch Semiconductor Structures | TRAN, JUDY DAO | — |
| 18887461 | Electrical Performance Prediction Based On Structural Measurements Of Partially Fabricated Semiconductor Devices | MENDOZA, ALEXANDRIA ARELLANO | — |
| 18743048 | Measurements Of Semiconductor Structures Based On Data Collected At Prior Process Steps | QUIGLEY, KYLE ROBERT | — |
| 17978844 | Methods And Systems For Monitoring Metrology Fleet Productivity | ERDMAN, CHAD G | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18387015 | Methods And Systems For Measurement Of Semiconductor Structures With Active Tilt Correction | FABIAN JR, ROBERTO | 1d overdue |
| 18229606 | Methods And Systems For Systematic Error Compensation Across A Fleet Of Metrology Systems Based On A Trained Error Evaluation Model | GAVIA, NYLA EMANI ANN | 35d |
| 18977795 | Methods And Systems For Reflectometry Based Measurements Of Deep, Large Pitch Semiconductor Structures | TRAN, JUDY DAO | — |
| 18972428 | Measurements Of Complex Semiconductor Structures Based On Component Measurement Signals | HANSEN, JONATHAN M | — |
| 18887461 | Electrical Performance Prediction Based On Structural Measurements Of Partially Fabricated Semiconductor Devices | MENDOZA, ALEXANDRIA ARELLANO | — |
| 18743048 | Measurements Of Semiconductor Structures Based On Data Collected At Prior Process Steps | QUIGLEY, KYLE ROBERT | — |
| 18416113 | X-Ray Scatterometry Based Measurements Of Memory Array Structures Stacked With Complex Logic Structures | LU, ZHIYU | — |
| 17978844 | Methods And Systems For Monitoring Metrology Fleet Productivity | ERDMAN, CHAD G | — |
| Client (Assignee) | Pending OAs |
|---|---|
| KLA | 9 |
| Hamamatsu Photonics | 1 |
| Art Unit | Apps |
|---|---|
| 2877 | 4 |
| 2857 | 2 |
| 2884 | 1 |
| 2665 | 1 |
| 2116 | 1 |
| 2899 | 1 |
| App # | Title | Client | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|---|
| 19050479 | High Brightness X-Ray Source For Semiconductor Metrology | Hamamatsu Photonics K.K. | THOMAS, COURTNEY D | 2884 | §103 | Non-Final OA | — | Pending | Feb 11, 2025 |
| 18977795 | Methods And Systems For Reflectometry Based Measurements Of Deep, Large Pitch Semiconductor Structures | Kla Corporation | TRAN, JUDY DAO | 2877 | §103§112 | Non-Final OA | — | Pending | Dec 11, 2024 |
| 18972428 | Measurements Of Complex Semiconductor Structures Based On Component Measurement Signals | Kla Corporation | HANSEN, JONATHAN M | 2877 | §102 | Non-Final OA | — | Pending | Dec 06, 2024 |
| 18887461 | Electrical Performance Prediction Based On Structural Measurements Of Partially Fabricated Semiconductor Devices | Kla Corporation | MENDOZA, ALEXANDRIA ARELLANO | 2877 | §102§103 | Non-Final OA | — | Pending | Sep 17, 2024 |
| 18743048 | Measurements Of Semiconductor Structures Based On Data Collected At Prior Process Steps | Kla Corporation | QUIGLEY, KYLE ROBERT | 2857 | §101§102§103§112 | Non-Final OA | — | Pending | Jun 13, 2024 |
| 18416113 | X-Ray Scatterometry Based Measurements Of Memory Array Structures Stacked With Complex Logic Structures | Kla Corporation | LU, ZHIYU | 2665 | §103 | Non-Final OA | — | Pending | Jan 18, 2024 |
| 18387015 | Methods And Systems For Measurement Of Semiconductor Structures With Active Tilt Correction | Kla Corporation | FABIAN JR, ROBERTO | 2877 | §101 | Non-Final OA | 1d overdue | Pending | Nov 04, 2023 |
| 18229606 | Methods And Systems For Systematic Error Compensation Across A Fleet Of Metrology Systems Based On A Trained Error Evaluation Model | Kla Corporation | GAVIA, NYLA EMANI ANN | 2857 | §101 | Non-Final OA | 35d | Pending | Aug 02, 2023 |
| 17978844 | Methods And Systems For Monitoring Metrology Fleet Productivity | Kla Corporation | ERDMAN, CHAD G | 2116 | §103§112 | Non-Final OA | — | Pending | Nov 01, 2022 |
| 17590116 | Methods And Systems For Accurate Measurement Of Deep Structures Having Distorted Geometry | Kla Corporation | JEFFERSON, QUOVAUNDA | 2899 | §103 | Final Rejection | — | Pending | Feb 01, 2022 |
IP Author helps law firms respond to office actions faster with AI-generated responses, examiner analytics, and prosecution intelligence.
Start Free Trial99.5% of resolved applications prosecuted by Spano Law Group were allowed, across 219 applications in USPTO records.
2.59 office actions per allowed application on average.
10 pending office actions as of October 2026, for 2 clients, before 10 examiners in 6 art units.
