Prosecution Insights
Prosecution Insights
6 pending office actions • 3 art units • 5 examiners • 0 of 6 (0%) have an AI response strategy ready • 4 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 3 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 3 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §103 only | 3 (50%) |
| §102 only | 2 (33%) |
| Multi-statute (no §101) | 1 (17%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| STOCK JR, GORDON J | 2 | 81.4% | +17.6% |
| AYUB, HINA F | 1 | 84.7% | +17.6% |
| AKANBI, ISIAKA O | 1 | 76.6% | +22.9% |
| MCDONNOUGH, COURTNEY G | 1 | 81.7% | +17.9% |
| MCCORMACK, JASON L | 1 | 84.6% | +7.9% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 4 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18335485 | DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS | STOCK JR, GORDON J | 29d |
| 18350643 | METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR MEASURING DIELECTRIC/SEMICONDUCTOR INTERFACE TRAP DENSITY USING SCANNING ELECTRON MICROSCOPE CHARGING | MCCORMACK, JASON L | 70d |
| 19023118 | WAFER METROLOGY TECHNOLOGIES | AYUB, HINA F | — |
| 18350250 | APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE | MCDONNOUGH, COURTNEY G | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18462208 | METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATION COMPONENTS, THROUGH VARIATION IN THE INPUT PROBING LASER POLARIZATION | STOCK JR, GORDON J | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 5 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18884050 | NONLINEAR OPTICAL STOKES ELLIPSOMETERS | AKANBI, ISIAKA O | 26d |
| 18335485 | DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS | STOCK JR, GORDON J | 29d |
| 19023118 | WAFER METROLOGY TECHNOLOGIES | AYUB, HINA F | — |
| 18462208 | METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATION COMPONENTS, THROUGH VARIATION IN THE INPUT PROBING LASER POLARIZATION | STOCK JR, GORDON J | — |
| 18350250 | APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE | MCDONNOUGH, COURTNEY G | — |
| Art Unit | Apps |
|---|---|
| 2877 | 4 |
| 2858 | 1 |
| 2881 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19023118 | WAFER METROLOGY TECHNOLOGIES | AYUB, HINA F | 2877 | §102 | Non-Final OA | — | Pending | Jan 15, 2025 |
| 18884050 | NONLINEAR OPTICAL STOKES ELLIPSOMETERS | AKANBI, ISIAKA O | 2877 | §103 | Non-Final OA | 26d | Pending | Sep 12, 2024 |
| 18462208 | METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATION COMPONENTS, THROUGH VARIATION IN THE INPUT PROBING LASER POLARIZATION | STOCK JR, GORDON J | 2877 | §102§103 | Final Rejection | — | Pending | Sep 06, 2023 |
| 18350250 | APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE | MCDONNOUGH, COURTNEY G | 2858 | §103 | Final Rejection | — | Pending | Jul 11, 2023 |
| 18350643 | METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR MEASURING DIELECTRIC/SEMICONDUCTOR INTERFACE TRAP DENSITY USING SCANNING ELECTRON MICROSCOPE CHARGING | MCCORMACK, JASON L | 2881 | §103 | Final Rejection | 70d | Pending | Jul 11, 2023 |
| 18335485 | DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS | STOCK JR, GORDON J | 2877 | §102 | Non-Final OA | 29d | Pending | Jun 15, 2023 |
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