Prosecution Insights
Prosecution Insights
Technology area: Semiconductors, Circuits & Optics
6 pending office actions • 3 art units • 5 examiners • 0 of 6 (0%) have an AI response strategy ready • 4 patents granted in the last 365 days
Femtometrix Inc. is currently prosecuting 7 pending office actions within the Semiconductors, Circuits & Optics technology area. These actions are distributed among 6 distinct examiners, which indicates that examiners are generally handling individual matters. The portfolio is spread across 3 distinct art units, showing that the company's semiconductor and optical technologies are being reviewed by several specialized groups.
STOCK JR, GORDON J is the busiest examiner for the company, with 2 pending office actions currently under review. This accounts for a portion of the 7 pending office actions, leaving the remaining matters to be handled by the other 6 distinct examiners. The presence of 3 distinct art units suggests that the applications cover a variety of technical sub-fields within the broader Semiconductors, Circuits & Optics area.
With multiple distinct examiners involved, the company must navigate various examination styles. The current docket represents an active pipeline for Femtometrix Inc. The fact that the busiest examiner, STOCK JR, GORDON J, has 2 pending office actions suggests a concentration of work, while the overall distribution remains broad across the different art units.
Based on the USPTO statutory response window for each pending office action. 3 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 3 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 + other | 1 (17%) |
| §103 only | 3 (50%) |
| §102 only | 1 (17%) |
| Multi-statute (no §101) | 1 (17%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| STOCK JR, GORDON J | 2 | 81.5% | +17.5% |
| AKANBI, ISIAKA O | 1 | 76.6% | +22.8% |
| LAU, TUNG S | 1 | 83.0% | +14.5% |
| MCCORMACK, JASON L | 1 | 84.6% | +8.1% |
| MCDONNOUGH, COURTNEY G | 1 | 81.6% | +18.1% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 3 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18335485 | DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS | STOCK JR, GORDON J | 29d |
| 18350643 | METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR MEASURING DIELECTRIC/SEMICONDUCTOR INTERFACE TRAP DENSITY USING SCANNING ELECTRON MICROSCOPE CHARGING | MCCORMACK, JASON L | 70d |
| 18350250 | APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE | MCDONNOUGH, COURTNEY G | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 2 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18641170 | SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS | LAU, TUNG S | — |
| 18462208 | METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATION COMPONENTS, THROUGH VARIATION IN THE INPUT PROBING LASER POLARIZATION | STOCK JR, GORDON J | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 5 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18884050 | NONLINEAR OPTICAL STOKES ELLIPSOMETERS | AKANBI, ISIAKA O | 26d |
| 18335485 | DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS | STOCK JR, GORDON J | 29d |
| 18641170 | SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS | LAU, TUNG S | — |
| 18462208 | METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATION COMPONENTS, THROUGH VARIATION IN THE INPUT PROBING LASER POLARIZATION | STOCK JR, GORDON J | — |
| 18350250 | APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE | MCDONNOUGH, COURTNEY G | — |
| Art Unit | Apps |
|---|---|
| 2877 | 3 |
| 2881 | 1 |
| 2858 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18884050 | NONLINEAR OPTICAL STOKES ELLIPSOMETERS | AKANBI, ISIAKA O | 2877 | §103 | Non-Final OA | 26d | Pending | Sep 12, 2024 |
| 18641170 | SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS | LAU, TUNG S | — | §101§112 | Non-Final OA | — | Pending | Apr 19, 2024 |
| 18462208 | METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATION COMPONENTS, THROUGH VARIATION IN THE INPUT PROBING LASER POLARIZATION | STOCK JR, GORDON J | 2877 | §102§103 | Final Rejection | — | Pending | Sep 06, 2023 |
| 18350643 | METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR MEASURING DIELECTRIC/SEMICONDUCTOR INTERFACE TRAP DENSITY USING SCANNING ELECTRON MICROSCOPE CHARGING | MCCORMACK, JASON L | 2881 | §103 | Final Rejection | 70d | Pending | Jul 11, 2023 |
| 18350250 | APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE | MCDONNOUGH, COURTNEY G | 2858 | §103 | Final Rejection | — | Pending | Jul 11, 2023 |
| 18335485 | DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS | STOCK JR, GORDON J | 2877 | §102 | Non-Final OA | 29d | Pending | Jun 15, 2023 |
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