Tech Center 2800 • Art Units: 2881
This examiner grants 84% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18243835 | PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18241570 | SUBSTRATE INSPECTION APPARATUS AND A METHOD OF INSPECTING A SUBSTRATE USING THE SAME | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18462647 | NANOFLUIDIC CELL FOR CHARACTERIZATION OF NANO-BUBBLES IN A SIMULATED RESERVOIR | Non-Final OA | Saudi Arabian Oil Company |
| 18421373 | ELECTRON MICROSCOPE DETECTOR AND RELATED METHODS | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18419940 | APPARATUS FOR ANALYSING AND/OR PROCESSING A SAMPLE WITH A PARTICLE BEAM AND METHOD | Non-Final OA | Carl Zeiss SMT GmbH |
| 18226901 | METHOD FOR ELECTRON BEAM-INDUCED PROCESSING OF A DEFECT OF A MICROLITHOGRAPHIC PHOTOMASK | Final Rejection | Carl Zeiss SMT GmbH |
| 18562769 | ULTRAVIOLET LIGHT IRRADIATION SYSTEM AND ULTRAVIOLET LIGHT IRRADIATION METHOD | Non-Final OA | NIPPON TELEGRAPH AND TELEPHONE CORPORATION |
| 18384791 | CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD | Final Rejection | ASML Netherlands B.V. |
| 18281272 | SYSTEM AND METHOD FOR INSPECTION BY DEFLECTOR CONTROL IN A CHARGED PARTICLE SYSTEM | Non-Final OA | ASML Netherlands B.V. |
| 18269532 | OPERATION METHODS OF 2D PIXELATED DETECTOR FOR AN APPARATUS WITH PLURAL CHARGED-PARTICLE BEAMS AND MAPPING SURFACE POTENTIALS | Final Rejection | ASML Netherlands B.V. |
| 18320157 | INSPECTION METHOD AND INSPECTION TOOL | Non-Final OA | ASML Netherlands B.V. |
| 18115712 | READOUT CIRCUIT FOR PIXELIZED ELECTRON DETECTOR | Non-Final OA | ASML Netherlands B.V. |
| 18018578 | SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION IN AN INSPECTION APPARATUS | Non-Final OA | ASML Netherlands B.V. |
| 18350643 | METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR MEASURING DIELECTRIC/SEMICONDUCTOR INTERFACE TRAP DENSITY USING SCANNING ELECTRON MICROSCOPE CHARGING | Non-Final OA | FemtoMetrix, Inc. |
| 18542072 | Optics for In-Situ Scanning Electron Microscope Repair | Non-Final OA | KLA Corporation |
| 18322251 | THREE-DIMENSIONAL PRINTED NANOSPRAY INTERFACE FOR MASS SPECTROMETRY | Non-Final OA | AGILENT TECHNOLOGIES, INC. |
| 18360197 | Fastening an object to a manipulator and/or to an object holder in a particle beam apparatus | Non-Final OA | Carl Zeiss Microscopy GmbH |
| 17974702 | METHOD FOR PRODUCING A SAMPLE ON AN OBJECT, COMPUTER PROGRAM PRODUCT, AND MATERIAL PROCESSING DEVICE FOR CARRYING OUT THE METHOD | Final Rejection | Carl Zeiss Microscopy GmbH |
| 18402619 | NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VIA X-RAY MODELLING BASED ON SIMULATIONS AND GROUND TRUTH MEASUREMENTS | Non-Final OA | Applied Materials Israel Ltd. |
| 18569773 | Internal Fragment Reduction in Top Down ECD Analysis of Proteins | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 18560458 | SYSTEMS AND METHODS FOR IMPROVED INTENSIT Y DETERMINATIONS IN MASS ANALYSIS INSTRUMENTS | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 18458929 | FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION | Non-Final OA | FEI Company |
| 18128223 | Method and system for analyzing three-dimensional features | Non-Final OA | FEI Company |
| 18421161 | ULTRAVIOLET LIGHT EMISSION DEVICE | Non-Final OA | Ushio Denki Kabushiki Kaisha |
| 18519865 | OBJECTIVE LENS AND CHARGED PARTICLE BEAM APPARATUS INCLUDING SAME | Non-Final OA | KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE |
| 18421285 | METHOD FOR DEFINING A SCANNING SEQUENCE FOR RADIATION TREATMENT OF A TARGET VOLUME, BY PENCIL BEAM SCANNING (PBS) AT ULTRA HIGH DOSE DEPOSITION RATE (HDR) | Non-Final OA | ION BEAM APPLICATIONS S.A |
| 18577438 | THIN-FILM-BASED ASSEMBLY | Non-Final OA | VITROTEM B.V. |
| 18574091 | IMPROVED TEMPERATURE CONTROL IN LIQUID PHASE TRANSMISSION ELECTRON MICROSCOPY | Non-Final OA | Danmarks Tekniske Universitet |
| 18571630 | SYSTEM AND METHOD FOR SAMPLING | Non-Final OA | HELSINGIN YLIOPISTO |
| 18541778 | DEVICE FOR CONTROLLING TRAPPED IONS | Non-Final OA | Oxford Ionics Limited |
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