Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2881
This examiner grants 84% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18243835 | PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18241570 | SUBSTRATE INSPECTION APPARATUS AND A METHOD OF INSPECTING A SUBSTRATE USING THE SAME | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18366322 | APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18462647 | NANOFLUIDIC CELL FOR CHARACTERIZATION OF NANO-BUBBLES IN A SIMULATED RESERVOIR | Non-Final OA | Saudi Arabian Oil Company |
| 18419940 | APPARATUS FOR ANALYSING AND/OR PROCESSING A SAMPLE WITH A PARTICLE BEAM AND METHOD | Non-Final OA | Carl Zeiss SMT GmbH |
| 18421373 | ELECTRON MICROSCOPE DETECTOR AND RELATED METHODS | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18562769 | ULTRAVIOLET LIGHT IRRADIATION SYSTEM AND ULTRAVIOLET LIGHT IRRADIATION METHOD | Non-Final OA | NIPPON TELEGRAPH AND TELEPHONE CORPORATION |
| 18384791 | CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD | Final Rejection | ASML Netherlands B.V. |
| 18320157 | INSPECTION METHOD AND INSPECTION TOOL | Non-Final OA | ASML Netherlands B.V. |
| 18018578 | SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION IN AN INSPECTION APPARATUS | Final Rejection | ASML Netherlands B.V. |
| 18542072 | Optics for In-Situ Scanning Electron Microscope Repair | Non-Final OA | KLA Corporation |
| 18350643 | METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR MEASURING DIELECTRIC/SEMICONDUCTOR INTERFACE TRAP DENSITY USING SCANNING ELECTRON MICROSCOPE CHARGING | Final Rejection | FemtoMetrix, Inc. |
| 18360197 | Fastening an object to a manipulator and/or to an object holder in a particle beam apparatus | Non-Final OA | Carl Zeiss Microscopy GmbH |
| 18458929 | FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION | Final Rejection | FEI Company |
| 17989550 | Method Of Imaging And Milling A Sample | Non-Final OA | FEI Company |
| 18421161 | ULTRAVIOLET LIGHT EMISSION DEVICE | Non-Final OA | Ushio Denki Kabushiki Kaisha |
| 18569773 | Internal Fragment Reduction in Top Down ECD Analysis of Proteins | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 18577438 | THIN-FILM-BASED ASSEMBLY | Non-Final OA | VITROTEM B.V. |
| 18574091 | IMPROVED TEMPERATURE CONTROL IN LIQUID PHASE TRANSMISSION ELECTRON MICROSCOPY | Non-Final OA | Danmarks Tekniske Universitet |
| 18541778 | DEVICE FOR CONTROLLING TRAPPED IONS | Non-Final OA | Oxford Ionics Limited |
| 18564683 | ULTRAVIOLET STERILIZATION DEVICE AND OPERATION CONTROL METHOD THEREOF | Non-Final OA | ADVANCE SOLUTION CO., LTD |
| 18514864 | MOBILE BIDIRECTIONAL STERILIZATION DEVICE AND VEHICLE EQUIPPED WITH SAME | Non-Final OA | DUCK YANG INDUSTRY CO., LTD. |
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