Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2858 2866
This examiner grants 82% of resolved cases
Courtney G. McDonnough serves in Tech Center 2800 and Art Unit 2858. With 575 resolved cases, the examiner has an allowance rate of 81.6%. This is a high rate, indicating that a large majority of applications result in a patent grant. This 81.6% allowance rate suggests a very favorable environment for applicants, where the examiner is open to finding allowable subject matter within the technical field of Art Unit 2858.
The data shows an interview lift of 18.1%, suggesting that interviews are a helpful tactic for resolving issues. An interview provides a meaningful increase in the likelihood of allowance beyond the already strong 81.6% baseline. The median days to allowance is 970, which is a relatively fast timeframe for prosecution. This 970-day median suggests an efficient path to issuance for successful applications. For practitioners, the 18.1% interview lift and the 81.6% allowance rate across 575 resolved cases provide a clear roadmap. Engaging the examiner directly can help maintain the efficient 970-day pace and further improve the chances of a positive outcome in Tech Center 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18545600 | SYSTEM AND METHOD FOR DETERMINING ELECTRONIC DEVICE THERMAL RESISTANCE CHARACTERISTICS | Final Rejection | NXP USA, Inc. |
| 18417806 | COIL UNIT AND MAGNETIC RESONANCE IMAGING APPARATUS INCLUDING COIL UNIT | Non-Final OA | FUJIFILM Healthcare Corporation |
| 18336939 | MEASURING EQUIPMENT AND MEASURING METHOD FOR MEASURING ELECTRONIC PROPERTIES AND OPTICAL PROPERTIES | Final Rejection | Innolux Corporation |
| 18217200 | Architecture and Testing for an Integrated Circuit Package | Non-Final OA | Altera Corporation |
| 18620862 | BATTERY CELL, BATTERY, ELECTRICITY-CONSUMING APPARATUS, DETECTING METHOD, AND DETECTING MODULE | Non-Final OA | CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED |
| 18688961 | WAFER INSPECTION APPARATUS | Non-Final OA | Hitachi High-Tech Corporation |
| 18621026 | INTEGRATED CIRCUIT AND INTEGRATED CIRCUIT TESTING METHOD | Non-Final OA | Realtek Semiconductor Corp. |
| 18795589 | SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSIS METHOD | Non-Final OA | HAMAMATSU PHOTONICS K.K. |
| 18929921 | AUTOMATED BATTERY ISOLATION TESTING SYSTEM WITH DUAL-CHANNEL MULTIMETER INTEGRATION FOR ELECTRIFIED VEHICLES | Non-Final OA | FCA US LLC |
| 18947372 | LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT CHIPS | Non-Final OA | Smiths Interconnect Americas, Inc. |
| 18350250 | APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE | Final Rejection | FemtoMetrix, Inc. |
| 18624355 | DIAGNOSIS OF MOBILE DEVICES USING BUILT-IN ACTUATORS AND SENSORS | Non-Final OA | BLANCCO TECHNOLOGY GROUP IP OY |
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