Prosecution Insights
Last updated: October 02, 2026

Examiner: ZAKARIA, AKM

Tech Center 3700 • Art Units: 2812 2858 2868 3726

This examiner grants 83% of resolved cases

Analysis

Akm Zakaria has resolved 831 cases in Art Unit 2812 of Technology Center 3700. The examiner has an allowance rate of 82.6 percent. The median days to allowance is 873, which is the timeline for this volume of cases. The interview lift of 16.1 percent indicates that direct communication is effective. With 831 cases resolved, the 82.6 percent allowance rate suggests the environment for applicants.

The 873-day median pendency is a metric for planning prosecution in this art unit. The 16.1 percent lift shows that the examiner is open to resolving issues through discussion. Practitioners should use the 82.6 percent allowance rate as a baseline for success. The 873-day timeline is a benchmark for the 3700 technology center. This data provides a view of the examiner's consistent approach to patent examination over 831 resolved cases.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

82.6%
Allow Rate
+12.6% vs TC avg
865
Total Applications
+16.1%
Interview Lift
873
Avg Prosecution Days
Based on 831 resolved cases, 2023–2026

Rejection Statute Breakdown

3.7%
§101 Eligibility
20.3%
§102 Novelty
55.6%
§103 Obviousness
19.1%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18620139 DISPLAY DRIVING APPARATUS, DATA TRANSMITTING METHOD, IMAGE DATA INSPECTION METHOD Non-Final OA LX SEMICON CO., LTD.
18795475 EVALUATION JIG AND EVALUATION METHOD Non-Final OA TOYOTA JIDOSHA KABUSHIKI KAISHA
19036261 Capacitor Health Diagnostics Non-Final OA ABB Schweiz AG
18436609 Method of Monitoring Thermal Parameters of An Electrical Machine Final Rejection ABB Schweiz AG
18584927 DEVICE FOR TESTING ELEMENTS OF DISPLAY PANEL Non-Final OA Samsung Display Co., LTD.
18781445 INFORMATION PROCESSING METHOD, INFORMATION PROCESSING DEVICE, AND NON-TRANSITORY COMPUTER READABLE STORAGE MEDIUM Final Rejection Panasonic Intellectual Property Corporation of America
19035246 Measured Value Acquisition Device for an Inductive Sensor Arrangement Non-Final OA Robert Bosch GmbH
19066134 MAGNETIC RESONANCE IMAGING SYSTEMS AND METHODS Non-Final OA SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.
18916585 BATTERY DIAGNOSIS APPARATUS, BATTERY DIAGNOSIS METHOD AND BATTERY DIAGNOSIS SYSTEM Non-Final OA LG Energy Solution, Ltd.
18933369 SYSTEMS AND METHODS FOR SIGNAL-TO-NOISE RATIO (SNR) OPTIMIZATION USING BIAS CONTROL Non-Final OA Avago Technologies International Sales Pte. Limited
19009039 POWER ELECTRONICS MODULE CONDITION MONITORING Non-Final OA Rolls-Royce plc
18817886 Wireless Transmission Device and Magnetic Resonance Imaging Apparatus Non-Final OA Siemens Healthineers AG
18693032 MAGNETISM DETECTION DEVICE Non-Final OA SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18621603 TESTING CIRCUIT Final Rejection TEXAS INSTRUMENTS INCORPORATED
19077356 BATTERY MONITORING DEVICE Non-Final OA DENSO CORPORATION
18766856 IN-LINE ELECTRICAL DETECTION OF DEFECTS AT WAFER LEVEL Final Rejection Taiwan Semiconductor Manufacturing Company, LTD.
19032502 CURRENT SENSOR Non-Final OA Asahi Kasei Microdevices Corporation
18934255 CURRENT MEASUREMENT MODULE Non-Final OA Asahi Kasei Microdevices Corporation
18856142 MAGNETIC FIELD DETECTION SYSTEM Final Rejection TDK CORPORATION
18996245 ESTIMATION DEVICE, ESTIMATION METHOD, AND COMPUTER PROGRAM Non-Final OA GS Yuasa International Ltd.
18962928 MOTOR MALFUNCTION MONITORING DEVICE, DRIVE MOTOR SYSTEM AND MOTOR MALFUNCTION MONITORING METHOD Non-Final OA YANTAI JEREH PETROLEUM EQUIPMENT & TECHNOLOGIES CO., LTD.
19051051 TESTING METHOD AND TESTING DEVICE FOR ELECTRONIC CIRCUIT Non-Final OA United Microelectronics Corp.
18943062 MODULAR TEST SOCKET Non-Final OA TSE CO., LTD.
18669517 LOW CROSS-TALK INTERCONNECTION DEVICE WITH IMPEDANCE-TUNED HYBRID SHIELDING STRUCTURES FOR INTEGRATED CIRCUIT DEVICE TEST TOOLING Non-Final OA Essai, Inc.
18934034 TECHNIQUES FOR ELECTRICAL CHARACTERIZATION OF LOGICAL CELLS IN INTEGRATED CIRCUIT TESTING SYSTEMS Non-Final OA FEI Company
18946125 HIGH-POWER PULSED ELECTROMAGNETIC FIELD APPLICATOR SYSTEMS Non-Final OA Regenesis Biomedical, Inc.
18745727 User-Reconfigurable Metal Detector Customization and Installation System and Method Therefor Non-Final OA Garrett Electronics, Inc.

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