Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2812 2884
This examiner grants 78% of resolved cases
Edwin C. Gunberg serves in Tech Center 2800 and Art Unit 2812. The profile includes 633 resolved cases, which show an allowance rate of 78.0 percent. This 78.0 percent rate provides a baseline for practitioners to estimate the probability of a grant. With 633 resolved cases, the data provides a statistically significant look at the examiner's tendencies in this semiconductor and electronic component center.
The data shows an interview lift of 6.8 percent. This figure indicates that conducting an interview is associated with an increased probability of allowance compared to the baseline of cases where no interview occurs. Practitioners may consider the 6.8 percent lift when deciding whether to engage in direct communication. This positive lift suggests that verbal advocacy can be a factor in the prosecution process for Art Unit 2812.
The median days to allowance for Gunberg is 889. This 889-day timeline provides a benchmark for the expected duration of the prosecution process from filing to grant. The combination of the 78.0 percent allowance rate and the 6.8 percent interview lift offers a roadmap for applicants. Understanding these metrics, including the 889-day median, helps in setting expectations for both timing and results in Tech Center 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19093222 | RADIOGRAPHY APPARATUS AND CONTROL METHOD OF RADIOGRAPHY APPARATUS | Non-Final OA | FUJIFILM Corporation |
| 18972126 | MULTI-ROTATIONAL FIXTURES FOR RADIOGRAPHY SYSTEMS AND RADIOGRAPHY SYSTEMS INCLUDING MULTI-ROTATIONAL FIXTURES | Non-Final OA | Illinois Tool Works Inc. |
| 18783035 | IMAGE CAPTURE APPARATUS, METHOD, AND STORAGE MEDIUM | Final Rejection | CANON KABUSHIKI KAISHA |
| 18583977 | CONSOLE DEVICE, X-RAY DIAGNOSTIC APPARATUS, AND METHOD OF OPERATING IRRADIATION FIELD | Final Rejection | Canon Kabushiki Kaisha |
| 19037218 | SYSTEMS AND METHODS FOR DETERMINING COINCIDENCE EVENTS | Non-Final OA | SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD. |
| 18469509 | SYSTEMS AND METHODS FOR CONTROLLING IMAGING DEVICE | Non-Final OA | SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD. |
| 18881442 | VOLTAGE GENERATOR AND X-RAY IMAGING SYSTEM | Non-Final OA | KONINKLIJKE PHILIPS N.V. |
| 18723996 | METHOD AND APPARATUS FOR SAFETY MONITORING OF AN IMAGING SYSTEM | Final Rejection | KONINKLIJKE PHILIPS N.V. |
| 18630012 | IMAGING SYSTEMS AND METHODS | Non-Final OA | SIEMENS HEALTHINEERS INTERNATIONAL AG |
| 18550738 | SOLID-STATE IMAGING DEVICE AND ELECTRONIC DEVICE | Final Rejection | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18961750 | PROACTIVE DETECTION OF A COMPROMISED ATTACHMENT OF A GANTRY TO A FLOOR AND/OR A COMPONENT TO A ROTATING FRAME OF AN IMAGING SYSTEM | Non-Final OA | GE Precision Healthcare LLC |
| 18877850 | PARTICLE DETECTOR WITH REDUCED INTER-SYMBOL INTERFERENCE | Non-Final OA | ASML Netherlands B.V. |
| 18876191 | READOUT DESIGN FOR CHARGED PARTICLE COUNTING DETECTORS | Non-Final OA | ASML Netherlands B.V. |
| 18852549 | OPTICAL GAS SENSOR DEVICE, GAS DETECTION METHOD, AND STORAGE MEDIUM STORING PROGRAM | Final Rejection | MITSUMI ELECTRIC CO., LTD. |
| 18877290 | SEQUENCING SYSTEM WITH CURVED IMAGE PLANE OR OBJECT PLANE | Non-Final OA | ILLUMINA, INC. |
| 18920112 | ADAPTIVE INTRINSIC LOCK MASS CORRECTION | Non-Final OA | Micromass UK Limited |
| 18376674 | WAFER SCALE ENHANCED GAIN ELECTRON BOMBARDED CMOS IMAGER | Non-Final OA | Elbit Systems of America, LLC |
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