Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2829 2858 2859 2867
This examiner grants 77% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18652163 | ISOLATED TEST AND MEASUREMENT PROBE | Non-Final OA | Tektronix, Inc. |
| 18485257 | CUSTOMIZABLE SAFETY ENCLOSURE FOR A DEVICE UNDER TEST | Final Rejection | Tektronix, Inc. |
| 18777793 | BATTERY SYSTEM | Non-Final OA | TOYOTA JIDOSHA KABUSHIKI KAISHA |
| 18663193 | Electrical and Optical Semiconductor Probe Head | Non-Final OA | Teramount Ltd. |
| 18654789 | POSITION SENSOR | Non-Final OA | Schaeffler Technologies AG & Co. KG |
| 18426447 | SENSOR DEVICE HAVING FIRST INDUCTION COIL SET AND SECOND INDUCTION COIL SET FOR DETERMINING POSITION CHANGE OF METAL ITEM | Non-Final OA | Getac Technology Corporation |
| 18430787 | ROTOR FOR INDUCTIVE POSITION SENSOR | Non-Final OA | SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC |
| 18392317 | CURRENT-BASED BUILT-IN SELF-TEST FOR CIRCUIT COMPONENTS ARRANGED IN VARIED CONFIGURATIONS | Non-Final OA | SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC |
| 17906872 | POWER SUPPLY DEVICE AND VITAL SENSOR | Non-Final OA | NIHON KOHDEN CORPORATION |
| 18611024 | DYNAMIC ON-RESISTANCE AND THRESHOLD VOLTAGE INSTABILITY EVALUATION CIRCUIT FOR POWER DEVICES AND OPERATION METHOD THEREOF | Non-Final OA | National Yang Ming Chiao Tung University |
| 18776393 | NON-CONTACT AC/DC SENSING PROBE AND SENSING METHOD AND APPLICATION THEREOF | Non-Final OA | RONALD CHI KANG CHOU |
| 18685918 | ELECTRO-CONDUCTIVE CONTACT PIN AND VERTICAL PROBE CARD HAVING SAME | Final Rejection | POINT ENGINEERING CO., LTD. |
| 18484773 | TESTING HEAD WITH VERTICAL PROBES FOR A PROBE CARD AND CORRESPONDING METHOD OF ASSEMBLY | Final Rejection | Microtest S.p.A. |
| 18695994 | SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOARD INTERFACES | Non-Final OA | ANTARES ADVANCED TEST TECHNOLOGIES (SUZHOU) LIMITED |
| 18687416 | PROBE AND SOCKET FOR INSPECTION | Non-Final OA | Mikuro Spring Co., Ltd. |
| 18586534 | Adjustable Probe Tip | Non-Final OA | PMK Mess- und Kommunikationstechnik, GmbH |
| 18512234 | Module for exchanging an interface unit, test system with such a module, method for testing semiconductor elements and for exchanging interface units | Non-Final OA | Turbodynamics GmbH |
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