Prosecution Insights
Prosecution Insights
Tech Center 3700 • Art Units: 2881 3700
This examiner grants 100% of resolved cases
Larry Li is an examiner in Tech Center 3700 and Art Unit 2881. He has 4 resolved cases. The allowance rate for these cases is 100.0 percent. This figure indicates that all resolutions thus far have resulted in a patent grant. The interview lift is 0.0 percent. The median time to allowance is 973 days. This duration provides a timeline for the cases that have reached issuance.
With 4 resolved cases, the data set is small but shows a consistent outcome. The 100.0 percent allowance rate is a primary indicator for applicants in Art Unit 2881. The 0.0 percent interview lift suggests that interviews have not yet impacted the recorded outcomes. The 973 days median time to allowance helps in planning the prosecution lifecycle. These statistics offer an initial look at the examiner's performance in Tech Center 3700.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18758983 | METHOD FOR MANUFACTURING PARTICLE BEAM THERAPY SYSTEM AND PARTICLE BEAM THERAPY SYSTEM | Non-Final OA | TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION |
| 18574985 | ADDITIVE MANUFACTURING METHOD AND ADDITIVE MANUFACTURING DEVICE | Non-Final OA | MITSUBISHI HEAVY INDUSTRIES, LTD. |
| 18668768 | METAL OXIDE FILM, SEMICONDUCTOR DEVICE, AND METHOD FOR EVALUATING METAL OXIDE FILM | Final Rejection | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18732344 | SEMICONDUCTOR PROCESSING APPARATUS | Non-Final OA | Hitachi High-Tech Corporation |
| 18668327 | PHOTOELECTRON EMISSION MICROSCOPE | Final Rejection | Hitachi High-Tech Corporation |
| 18699609 | MULTIPOLE LENS AND CHARGED PARTICLE BEAM DEVICE | Non-Final OA | Hitachi High-Tech Corporation |
| 18283932 | Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device | Non-Final OA | Hitachi High-Tech Corporation |
| 18509343 | METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD FOR CLASSIFYING SEMICONDUCTOR STRUCTURE | Final Rejection | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. |
| 18566548 | AN ANALYZER SYSTEM | Final Rejection | Roche Diagnostics Operations, Inc. |
| 18838620 | MASS SPECTROMETER | Non-Final OA | SHIMADZU CORPORATION |
| 18294930 | Mass Spectrometer and Mass Spectrometry Method | Final Rejection | SHIMADZU CORPORATION |
| 18485311 | FLOW RATE SWITCHING MECHANISM AND MASS SPECTROMETER | Non-Final OA | SHIMADZU CORPORATION |
| 18907722 | Disinfection System For Wheelchairs | Non-Final OA | United States Government As Represented By The Department Of Veterans Affairs |
| 18796333 | EUV LIGHT GENERATION SYSTEM AND ELECTRONIC DEVICE MANUFACTURING METHOD | Non-Final OA | Gigaphoton Inc. |
| 18855625 | CHARGED-PARTICLE BEAM APPARATUS WITH LARGE FIELD-OF-VIEW AND METHODS THEREOF | Non-Final OA | ASML Netherlands B.V. |
| 18854000 | WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM | Non-Final OA | ASML Netherlands B.V. |
| 18706592 | WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM | Non-Final OA | ASML Netherlands B.V. |
| 18517642 | CHARGED PARTICLE DEVICE AND METHOD | Non-Final OA | ASML Netherlands B.V. |
| 18617482 | TIME OF FLIGHT MASS ANALYSIS SYSTEM | Non-Final OA | Thermo Fisher Scientific (Bremen) GmbH |
| 18294436 | MULTIPLE INLET APPARATUS FOR ISOTOPE RATIO SPECTROMETRY | Final Rejection | Thermo Fisher Scientific (Bremen) GmbH |
| 18630957 | PROTECTING A DETECTOR WHILE DISCHARGING A REGION OF A SAMPLE | Final Rejection | Applied Materials Israel Ltd |
| 18599138 | ELECTROSTATIC ENERGY FILTER MODULE | Final Rejection | Applied Materials Israel Ltd. |
| 18370303 | METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES | Final Rejection | Applied Materials Israel Ltd. |
| 18730019 | Atom Beam Generation Device, Physics Package, Physics Package for Optical Lattice Clock, Physics Package for Atomic Clock, Physics Package for Atomic Interferometer, Physics Package for Quantum Information Processing Device, and Physics Package System | Non-Final OA | JEOL Ltd. |
| 18776603 | Charged Particle Beam Apparatus and Camera Image Displaying Method | Non-Final OA | JEOL Ltd. |
| 18385022 | Electron Microscope, Multipole Element for Use Therein, and Control Method for Such Electron Microscope | Final Rejection | JEOL Ltd. |
| 18612557 | ION BEAM COLUMN ION SPECIES MEASUREMENT | Final Rejection | FEI Company |
| 18598369 | Cask Storing Radioactive Nuclear Material and for Cooling Liquified Radiation Shielding Material by Controlling Flow Between Primary and Expansion Tanks | Final Rejection | NAC International Inc. |
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