Tech Center 2800 • Art Units: 2881
This examiner grants 0% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18294930 | Mass Spectrometer and Mass Spectrometry Method | Non-Final OA | SHIMADZU CORPORATION |
| 18565713 | A THERMAL TRACE ENHANCER SYSTEM | Non-Final OA | TUSAS- TURK HAVACILIK VE UZAY SANAYII ANONIM SIRKETI |
| 18574985 | ADDITIVE MANUFACTURING METHOD AND ADDITIVE MANUFACTURING DEVICE | Non-Final OA | MITSUBISHI HEAVY INDUSTRIES, LTD. |
| 18517642 | CHARGED PARTICLE DEVICE AND METHOD | Non-Final OA | ASML Netherlands B.V. |
| 18370303 | METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES | Non-Final OA | Applied Materials Israel Ltd. |
| 18559758 | Gain Calibration for Quantitation Using On-Demand/Dynamic Implementation of MS Sensitivity Improvement Techniques | Non-Final OA | DH TECHNOLOGIES DEVELOPMENT PTE. LTD. |
| 18473035 | SAMPLE CARRIER AND USES THEREOF | Final Rejection | FEI Company |
| 18294436 | MULTIPLE INLET APPARATUS FOR ISOTOPE RATIO SPECTROMETRY | Non-Final OA | Thermo Fisher Scientific (Bremen) GmbH |
| 18461180 | BEAM DETECTOR, MULTI-CHARGED-PARTICLE-BEAM IRRADIATION APPARATUS, AND ADJUSTMENT METHOD FOR BEAM DETECTOR | Final Rejection | NuFlare Technology, Inc. |
| 18385022 | Electron Microscope, Multipole Element for Use Therein, and Control Method for Such Electron Microscope | Non-Final OA | JEOL Ltd. |
| 18389688 | COMPACT RADIATION DETECTION APPARATUS | Non-Final OA | FNC TECHNOLOGY CO., LTD. |
| 18567920 | CHARGED PARTICLE BEAM DEVICE AND METHOD FOR DEMAGNETIZING MAGNETIC LENS | Non-Final OA | Hitachi High-Tech Corporatiom |
| 18567274 | METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE POSITIONING OF A SAMPLE SUPPORT | Non-Final OA | TECHNISCHE UNIVERSITÄT WIEN |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy