Listed by the USPTO as RAHMAN, MOIN M
Tech Center 2800 • Art Units: 2699 2800 2898
This examiner grants 87% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18896219 | SEMICONDUCTOR DEVICE INCLUDING BIT LINES | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18613324 | MULTI-STACK SEMICONDUCTOR DEVICE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18514715 | SUBSTRATE AND SEMICONDUCTOR DEVICE INCLUDING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18382166 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18489028 | SEMICONDUCTOR MODULE | Final Rejection | FUJI ELECTRIC CO., LTD. |
| 17934388 | WHITE ORGANIC LIGHT EMITTING DEVICE WITH STABLE SPECTRUM EMPLOYING TRANSPORT BARRIER LAYERS | Final Rejection | The Regents of the University of Michigan |
| 18522409 | DISPLAY DEVICE | Final Rejection | LG Display Co., Ltd. |
| 17755897 | SOLID-STATE IMAGING DEVICE AND ELECTRONIC EQUIPMENT | Final Rejection | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18560169 | DISPLAY SUBSTRATE AND DISPLAY DEVICE | Non-Final OA | BOE TECHNOLOGY GROUP CO., LTD. |
| 18486970 | INTERPOSER CONNECTION STRUCTURES BASED ON WIRE BONDING | Final Rejection | QUALCOMM Incorporated |
| 17990794 | ORGANIC SEMICONDUCTOR ELEMENT, ORGANIC EL ELEMENT, AND PHOTODIODE | Final Rejection | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18840285 | DISPLAY PANEL, DISPLAY DEVICE AND DRIVING METHOD | Non-Final OA | BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD. |
| 18631597 | Reduction of the Floating Body Effect in N-Type MOSFET Devices | Non-Final OA | Murata Manufacturing Co., Ltd. |
| 15429403 | ENHANCED LATERAL CAVITY ETCH | Final Rejection | Texas Instruments Incorporated |
| 18704093 | SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD | Non-Final OA | Tokyo Electron Limited |
| 18531276 | LAYER BY LAYER ETCH PROCESS | Non-Final OA | Tokyo Electron Limited |
| 18536918 | PITCH CONFIGURATION FOR BACK-END-OF-LINE WIRING | Non-Final OA | International Business Machines Corporation |
| 18632033 | IMAGE SENSING DEVICE | Non-Final OA | SK hynix Inc. |
| 18514991 | SEMICONDUCTOR MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 18182657 | LEAKAGE CURRENT REDUCTION FOR CONTINUOUS ACTIVE REGIONS | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18424960 | SEMICONDUCTOR-ON-INSULATOR (SOI) STRUCTURE WITH VARIABLE RESISTIVITY EPITAXIAL SEMICONDUCTOR LAYERS AND METHODS OF MAKING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company Limited |
| 18522150 | SUPERLATTICE COMPOSITE STRUCTURE AND SEMICONDUCTOR LAMINATE STRUCTURE | Final Rejection | Wafer Works Corporation |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy87.1% of resolved applications examined by Moin M Rahman were allowed (762 resolved cases), compared with 73.0% across Art Unit 2699 over the last five years.
This examiner's interview lift is +14.0 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by Moin M Rahman took 883 days on average from filing to allowance.
Moin M Rahman examines applications in Art Unit 2699 in Tech Center 2800 (Semiconductors, Circuits & Optics).
