Tech Center 3600 • Art Units: 2858 3652
This examiner grants 84% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18716033 | BATTERY CELL WELD INSPECTION APPARATUS AND BATTERY CELL WELD INSPECTION METHOD USING THE SAME | Final Rejection | LG ENERGY SOLUTION, LTD. |
| 18741066 | METHOD AND TESTING SYSTEM FOR TESTING SEMICONDUCTOR CHIP PACKAGES | Final Rejection | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 18954255 | METHOD AND SYSTEM FOR DETECTING DEFECTIVE CELLS | Non-Final OA | Samsung SDI Co., Ltd. |
| 18916753 | MICRO-INTEGRATED CIRCUIT DETECTION SYSTEM AND DETECTION METHOD THEREOF | Non-Final OA | AUO Corporation |
| 18992048 | PLANAR COIL ARRAY AND DISPLACEMENT SENSOR | Non-Final OA | Hitachi Astemo, Ltd. |
| 18745685 | DETERMINE GAIN MARGIN FOR A CRYSTAL DRIVER | Non-Final OA | Microchip Technology Incorporated |
| 18857455 | DATA SET GENERATION METHOD, ELECTROMAGNETIC FIELD ANALYSIS METHOD AND A NON-TRANSITORY COMPUTER READABLE MEDIUM | Non-Final OA | JFE STEEL CORPORATION |
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