Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2858 2867
This examiner grants 87% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18710973 | DETECTION CIRCUIT | Non-Final OA | Mitsubishi Electric Corporation |
| 18737744 | CURRENT SENSE CIRCUIT AND CURRENT SENSING METHOD | Non-Final OA | Infineon Technologies AG |
| 18613687 | COMPACT BALUN STRUCTURE FOR BROADBAND TIME-DOMAIN APPLICATIONS | Non-Final OA | Tektronix, Inc. |
| 18777589 | ELECTRICAL CONDUCTIVITY DETECTOR | Non-Final OA | SHIMADZU CORPORATION |
| 18677437 | METHOD AND DEVICE FOR ON-DIE IMPEDANCE CALIBRATION | Non-Final OA | STMicroelectronics International N.V. |
| 18592941 | LOW-ENERGY RESISTANCE-BASED SENSING SYSTEM | Non-Final OA | STMicroelectronics International N.V. |
| 18757070 | THREE-DIMENSIONAL MICROSTRUCTURE PROVIDING ADDITIONAL CURRENT-CARRYING PATHWAYS FOR SENSORS | Non-Final OA | Duke University |
| 18362140 | TESTING PADDLE FOR SEMICONDUCTOR DEVICE CHARACTERIZATION | Non-Final OA | Sandisk Technologies, Inc. |
| 18786668 | Passive Magnetic Detection and Discrimination for Security Screening | Non-Final OA | Xtract One Technologies Inc. |
| 18833805 | MEASUREMENT APPARATUS FOR AND MEASUREMENT METHOD OF MEASURING MOISTURE OF MINERAL MATERIAL | Non-Final OA | SENFIT OY |
| 18472555 | RADIO FREQUENCY INDUCED MICRO LED INSPECTION | Non-Final OA | Orbotech Ltd. |
| 18648130 | APPARATUS AND METHOD FOR MEASURING CONTACT RESISTANCE | Non-Final OA | Keithley Instruments, LLC |
| 18525815 | Multipurpose Spacer | Non-Final OA | PMK Mess- und Kommunikationstechnik GmbH |
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