Tech Center 2100 • Art Units: 2111 2117
This examiner grants 77% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18581736 | MEMORY DEVICE AND MEMORY TEST SYSTEM THEREOF | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18592840 | RECONFIGURABLE TESTING OF AN INTEGRATED CIRCUIT | Non-Final OA | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 18924615 | PREDETERMINED PATTERN PROGRAM OPERATIONS | Non-Final OA | Micron Technology, Inc. |
| 18813037 | MEMORY SYSTEM AND DECODING METHOD FOR THE SAME | Non-Final OA | SK hynix Inc. |
| 18921122 | MEMORY FAULT PROCESSING METHOD AND APPARATUS, AND STORAGE MEDIUM | Non-Final OA | xFusion Digital Technologies Co., Ltd |
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