Tech Center 2100 • Art Units: 2111 2112 2117
This examiner grants 78% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18930158 | ERROR CORRECTION CIRCUIT, MEMORY SYSTEM AND ERROR CORRECTION METHOD | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18571195 | RLC BUFFER REDUCTION BASED ON NETWORK CODING AND OUTER CODE | Non-Final OA | QUALCOMM Incorporated |
| 18948507 | Method and System for Channel Estimation and Decoding Acceleration for Irregular LDPC Codes | Non-Final OA | SK hynix Inc. |
| 18813037 | MEMORY SYSTEM AND DECODING METHOD FOR THE SAME | Final Rejection | SK hynix Inc. |
| 18930248 | CHIP AND CHIP TESTING METHOD | Non-Final OA | REALTEK SEMICONDUCTOR CORPORATION |
| 19064788 | COMPUTER-READABLE RECORDING MEDIUM STORING NOISE INFORMATION ESTIMATION PROGRAM, NOISE INFORMATION ESTIMATION METHOD, AND INFORMATION PROCESSING APPARATUS | Non-Final OA | Fujitsu Limited |
| 18946235 | METHOD FOR COLLECTING VALLEY AND PEAK INFORMATION FOR DEBUGGING A MEMORY DEVICE | Non-Final OA | MICRON TECHNOLOGY, INC. |
| 18791243 | READ DISTURB SCAN USING FAILED BIT COUNT | Non-Final OA | Micron Technology, Inc. |
| 18929351 | Systems, Methods, and Devices of Design-For-Test Circuitry | Non-Final OA | Arm Limited |
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