Tech Center 3600 • Art Units: 2834 2872 2877 2878 3645
This examiner grants 87% of resolved cases
Mai Thi Ngoc Tran is an examiner in Tech Center 3600, Art Unit 2834. The examiner has 142 resolved cases. The data shows an allowance rate of 86.6 percent and an interview lift of 4.1 percent. The median days to allowance for these cases is 838.
The 4.1 percent interview lift is a metric that can be compared to the 86.6 percent base allowance rate. This indicates that conducting an interview is a method for increasing the likelihood of an allowance. The 838 day median pendency is the timeframe applicants can expect when navigating the resolved cases handled by this examiner in Art Unit 2834. Practitioners can consider how these metrics influence the overall prosecution timeline.
With 142 resolved cases, the examiner's statistics provide a view of the prosecution landscape. Practitioners can use the 86.6 percent allowance rate to assess the probability of a grant. The 4.1 percent lift and the Tech Center 3600 environment are factors for prosecution strategy. These data points help in setting expectations for clients.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18758813 | POLARIZED PHOTOPLETHYSMOGRAPHY (PPG) BIOSENSORS, ARRAYS AND SYSTEMS | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18729954 | INFORMATION PROCESSING DEVICE, CALCULATION METHOD, AND STORAGE MEDIUM | Non-Final OA | NEC Corporation |
| 18712289 | INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND NON-TRANSITORY RECORDING MEDIUM | Final Rejection | NEC Corporation |
| 19041753 | MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND MANUFACTURING METHOD | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18593184 | CHIP INTERCONNECT WITH OPTICAL AND DIFFERENTIAL SIGNAL INTERFACES | Non-Final OA | QUALCOMM Incorporated |
| 19051069 | FLUORESCENCE READING DEVICE AND FLUORESCENCE READING METHOD | Non-Final OA | Yokogawa Electric Corporation |
| 19170074 | IMAGE SENSOR FOR PERFORMING AN ANALOG BINNING OPERATION | Non-Final OA | SK hynix Inc. |
| 18873185 | DETECTOR SCHEME FOR DETECTING LASER VOLTAGE PROBING ATTACKS | Non-Final OA | NATIONAL UNIVERSITY OF SINGAPORE |
| 18475503 | DIRECTIONAL COUPLER WITH REDUCED PHASE DISTORTION | Non-Final OA | Honeywell International Inc. |
| 18834171 | METROLOGY METHOD AND ASSOCIATED METROLOGY DEVICE | Non-Final OA | ASML Netherlands B.V. |
| 19081029 | Mid-Infrared Optical Lens Assemblies for Confocal Laser Scanning Microscopy | Non-Final OA | The Board of Trustees of the University of Illinois |
| 18730559 | SENSOR MODULE, MANUFACTURING METHOD THEREFOR, AND SENSOR SYSTEM | Final Rejection | NIPPON CHEMI-CON CORPORATION |
| 18540191 | LIGHT SENSING LOW ENERGY WIRELESS TAG | Non-Final OA | Wiliot, Ltd. |
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