Prosecution Insights
Last updated: October 02, 2026

Examiner: XING, CHRISTINA ILONA

Tech Center 2800 • Art Units: 2877

This examiner grants 83% of resolved cases

Analysis

Christina Ilona Xing works in Art Unit 2877 of Tech Center 2800. She has 41 resolved cases and an allowance rate of 82.9%. The median days to allowance is 917, which is a standard timeframe for the physical and electronic technologies in this unit. These figures suggest a very favorable environment for applicants, with a high probability of success and efficient processing. Practitioners should find the 82.9% allowance rate to be a strong positive indicator for their cases.

The interview lift is 17.8%. This significant lift, combined with the high baseline allowance rate, suggests that the examiner is both efficient and responsive to direct engagement. With 41 resolved cases, the examiner has established a clear and positive track record. Applicants should factor the 917 days to allowance into their strategy. The 17.8% lift provides a meaningful boost for resolving any outstanding issues. Overall, the data supports a strategy of active communication to complement the already strong 82.9% probability of securing a patent grant.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

82.9%
Allow Rate
+14.9% vs TC avg
71
Total Applications
+17.8%
Interview Lift
917
Avg Prosecution Days
Based on 41 resolved cases, 2023–2026

Rejection Statute Breakdown

3.3%
§101 Eligibility
24.4%
§102 Novelty
56.2%
§103 Obviousness
13.2%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18874904 VELOCIMETER IN THE MEDIUM INFRARED FOR MEASURING VELOCITY Non-Final OA COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
19089779 OPTICAL MEASURING DEVICE, ACQUISITION METHOD, AND RECORDING MEDIUM Non-Final OA Mitsubishi Electric Corporation
18709996 SURFACE INSPECTION APPARATUS Final Rejection Hitachi High-Tech Corporation
18160274 METHODS AND APPARATUS FOR CALIBRATION OF SUBSTRATE PROCESSING CHAMBER PLACEMENT VIA IMAGING Final Rejection Applied Materials, Inc.
18068913 MODULATION UNIT FOR AN ENCODER Final Rejection Ocado Innovation Limited
19132977 FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD Non-Final OA HAMAMATSU PHOTONICS K.K.
18234773 MULTI-PITCH GRID OVERLAY TARGET FOR SCANNING OVERLAY METROLOGY Non-Final OA KLA Corporation
18790944 FLEX-SPECTRUM OPTICAL DETECTOR Final Rejection Lumentum Operations LLC
18790928 FLEX-SPECTRUM OPTICAL DETECTOR Non-Final OA Lumentum Operations LLC

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