Prosecution Insights
Prosecution Insights
10 pending office actions • 6 art units • 10 examiners • 0 of 10 (0%) have an AI response strategy ready • 15 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 2 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 + other | 2 (20%) |
| §103 only | 2 (20%) |
| Double-patenting + other | 1 (10%) |
| Multi-statute (no §101) | 5 (50%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| KIDWELL, KAITLYN ELIZABETH | 1 | 77.1% | +20.8% |
| BOOSALIS, FANI POLYZOS | 1 | 90.3% | +10.8% |
| HANEY, NOAH JAMES | 1 | 79.6% | +30.8% |
| KIM, KIHO | 1 | 85.4% | +4.4% |
| PATEL, PINALBEN V | 1 | 88.9% | +9.9% |
| LE, HUNG VAN | 1 | — | — |
| BESLER, CHRISTOPHER JAMES | 1 | 68.3% | +41.5% |
| HALL, ELIZABETH MARY CAMPBEL | 1 | 66.7% | +5.9% |
| MARINI, MATTHEW G | 1 | 60.4% | +21.7% |
| FELIX, BRADLEY OBAS | 1 | 15.0% | +43.8% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18894816 | SUBSTRATE MAPPING USING DEEP NEURAL-NETWORKS | PATEL, PINALBEN V | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18170792 | DEFECT DETECTION IN MANUFACTURED ARTICLES USING MULTI-CHANNEL IMAGES | FELIX, BRADLEY OBAS | 23d overdue |
| 18522038 | STAGE ACTUATOR PARTICLE SHIELD | BESLER, CHRISTOPHER JAMES | 46d |
| 19071685 | VARIABLE WAVELENGTH INTERFEROMETRY | KIDWELL, KAITLYN ELIZABETH | — |
| 19001226 | METHOD AND SYSTEM FOR AUTOMATED FEATURE INSPECTION AND ALIGNMENT IN SEMICONDCUTOR FABRICATION | BOOSALIS, FANI POLYZOS | — |
| 18986584 | METROLOGY BASED ON TIME RESOLVED NON-ACOUSTIC SIGNALS | KIM, KIHO | — |
| 18611195 | TRANSFER LEARNING FOR METROLOGY DATA ANALYSIS | LE, HUNG VAN | — |
| 18475684 | BLUR REDUCTION TECHNIQUES FOR SEMICONDUCTOR INSPECTION | HALL, ELIZABETH MARY CAMPBEL | — |
| 18358495 | LOG FILE AGGREGATOR AND DATA VISUALIZATION FOR SEMICONDUCTOR CONTROL SYSTEMS | MARINI, MATTHEW G | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 6 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18170792 | DEFECT DETECTION IN MANUFACTURED ARTICLES USING MULTI-CHANNEL IMAGES | FELIX, BRADLEY OBAS | 23d overdue |
| 18522038 | STAGE ACTUATOR PARTICLE SHIELD | BESLER, CHRISTOPHER JAMES | 46d |
| 19071685 | VARIABLE WAVELENGTH INTERFEROMETRY | KIDWELL, KAITLYN ELIZABETH | — |
| 19001226 | METHOD AND SYSTEM FOR AUTOMATED FEATURE INSPECTION AND ALIGNMENT IN SEMICONDCUTOR FABRICATION | BOOSALIS, FANI POLYZOS | — |
| 18991234 | METROLOGY DEVICE NORMALIZATION CHANNEL | HANEY, NOAH JAMES | — |
| 18358495 | LOG FILE AGGREGATOR AND DATA VISUALIZATION FOR SEMICONDUCTOR CONTROL SYSTEMS | MARINI, MATTHEW G | — |
| Art Unit | Apps |
|---|---|
| 2884 | 1 |
| 2877 | 1 |
| 3726 | 1 |
| 2872 | 1 |
| 2853 | 1 |
| 2671 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19071685 | VARIABLE WAVELENGTH INTERFEROMETRY | KIDWELL, KAITLYN ELIZABETH | — | §103§112 | Non-Final OA | — | Pending | Mar 05, 2025 |
| 19001226 | METHOD AND SYSTEM FOR AUTOMATED FEATURE INSPECTION AND ALIGNMENT IN SEMICONDCUTOR FABRICATION | BOOSALIS, FANI POLYZOS | 2884 | §102§112 | Non-Final OA | — | Pending | Dec 24, 2024 |
| 18991234 | METROLOGY DEVICE NORMALIZATION CHANNEL | HANEY, NOAH JAMES | 2877 | §103 | Non-Final OA | — | Pending | Dec 20, 2024 |
| 18986584 | METROLOGY BASED ON TIME RESOLVED NON-ACOUSTIC SIGNALS | KIM, KIHO | — | §102§103 | Non-Final OA | — | Pending | Dec 18, 2024 |
| 18894816 | SUBSTRATE MAPPING USING DEEP NEURAL-NETWORKS | PATEL, PINALBEN V | — | §103DP | Non-Final OA | — | Pending | Sep 24, 2024 |
| 18611195 | TRANSFER LEARNING FOR METROLOGY DATA ANALYSIS | LE, HUNG VAN | — | §101§103 | Non-Final OA | — | Pending | Mar 20, 2024 |
| 18522038 | STAGE ACTUATOR PARTICLE SHIELD | BESLER, CHRISTOPHER JAMES | 3726 | §102§103 | Final Rejection | 46d | Pending | Nov 28, 2023 |
| 18475684 | BLUR REDUCTION TECHNIQUES FOR SEMICONDUCTOR INSPECTION | HALL, ELIZABETH MARY CAMPBEL | 2872 | §102§103§112 | Final Rejection | — | Pending | Sep 27, 2023 |
| 18358495 | LOG FILE AGGREGATOR AND DATA VISUALIZATION FOR SEMICONDUCTOR CONTROL SYSTEMS | MARINI, MATTHEW G | 2853 | §101§103 | Final Rejection | — | Pending | Jul 25, 2023 |
| 18170792 | DEFECT DETECTION IN MANUFACTURED ARTICLES USING MULTI-CHANNEL IMAGES | FELIX, BRADLEY OBAS | 2671 | §103 | Non-Final OA | 23d overdue | Pending | Feb 17, 2023 |
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