Prosecution Insights
Prosecution Insights
Tech Center 3700 • Art Units: 2877 2884 2886 3772
This examiner grants 79% of resolved cases
Jonathan M Hansen operates in Tech Center 3700 and Art Unit 2877. He has handled 768 resolved cases, maintaining an allowance rate of 79.4%. This rate indicates a high probability of success for applicants. The median days to allowance is 895, which serves as a benchmark for the expected time from filing to grant.
The interview lift for this examiner is 11.4%. This increase suggests that while interviews are helpful, the examiner's baseline allowance rate of 79.4% is already quite high. The 768 resolved cases provide a substantial data set for these conclusions. Practitioners can expect a median of 895 days for the prosecution process to reach an allowance.
In Art Unit 2877, Hansen's metrics provide a clear picture of his examination style. The 79.4% allowance rate and 11.4% interview lift suggest a receptive examiner where interviews provide a moderate benefit. With 768 resolved cases from Tech Center 3700, these figures offer a reliable basis for managing client expectations.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19020416 | SEMICONDUCTOR PROCESS APPARATUS | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18929773 | OPTOMECHANICAL TRANSDUCTION SYSTEM FOR PHOTOACOUSTIC SPECTROMETRY | Final Rejection | COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES |
| 18715031 | PROCESSING METHOD, PROCESSING APPARATUS, AND PROCESSING SYSTEM | Non-Final OA | Lenovo (Beijing) Limited |
| 18881990 | SENSOR MODULE FOR RAMAN SPECTROSCOPY, ELECTRONIC DEVICE AND METHOD OF CONDUCTING RAMAN SPECTROSCOPY | Non-Final OA | ams International AG |
| 19218637 | ANALOG DUAL-COMB SENSING WITH CONTINUOUS-WAVE LOCAL OSCILLATION | Non-Final OA | NEC Laboratories America, Inc. |
| 17515296 | EMBEDDED OPTICAL FILTER AND ANTI-REFLECTION IMPLEMENTATION WITH METAMATERIALS | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 19199050 | Static Dome Assembly for LiDAR Systems | Non-Final OA | Waymo LLC |
| 19186929 | SAMPLE ANALYZER | Non-Final OA | SYSMEX CORPORATION |
| 18764411 | Analysis Method and Composite Analysis Apparatus | Non-Final OA | SHIMADZU CORPORATION |
| 18732519 | OPTICAL PARTICLE COUNTER AND METHODS | Non-Final OA | ENTEGRIS, INC. |
| 19175185 | SHEET FIXING APPARATUS AND METHOD OF MANUFACTURING COMBINATION OF WORKPIECE AND SHEET FIXED THERETO | Non-Final OA | DISCO CORPORATION |
| 18864761 | METHOD OF SPATIALLY ALIGNING A PATTERNING DEVICE AND A SUBSTRATE | Final Rejection | ASML NETHERLANDS B.V. |
| 18838135 | INSPECTION TOOL AND BARRIER FOR USE THEREIN | Final Rejection | ASML Netherlands B.V. |
| 18720941 | SUBSTRATE COMPRISING A TARGET ARRANGEMENT, ASSOCIATED PATTERNING DEVICE AND METROLOGY METHOD | Non-Final OA | ASML Netherlands B.V. |
| 18280459 | DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY METHOD | Non-Final OA | ASML HOLDING N. V. |
| 17878266 | ADAPTIVE LIGHT BARRIER PROCESSING | Non-Final OA | STRATEC SE |
| 18907077 | SIMULTANEOUS CONFOCAL AND NON-CONFOCAL RAMAN SPECTROSCOPY | Final Rejection | Onto Innovation Inc. |
| 18986066 | MULTI-AZIMUTH ILLUMINATION AND IMAGING INSPECTION SYSTEM AND METHOD | Non-Final OA | KLA Corporation |
| 18972428 | Measurements Of Complex Semiconductor Structures Based On Component Measurement Signals | Non-Final OA | KLA Corporation |
| 18594707 | SYSTEM AND METHOD TO REDUCE MEASUREMENT ERROR IN INTERFEROMETRY-BASED METROLOGY | Final Rejection | KLA Corporation |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy