Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2825 2851
This examiner grants 86% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18348469 | METHOD AND SYSTEM FOR MEASURING STRUCTURE BASED ON SPECTRUM | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18162120 | INTEGRATED CIRCUITS INCLUDING ABUTTED BLOCKS AND METHODS OF DESIGNING LAYOUTS OF THE INTEGRATED CIRCUITS | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18378444 | TRANSISTOR CHARACTERISTIC SIMULATION DEVICE, TRANSISTOR CHARACTERISTIC SIMULATION METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM STORING TRANSISTOR CHARACTERISTIC SIMULATION PROGRAM | Non-Final OA | Mitsubishi Electric Corporation |
| 19061951 | ELECTRONIC DESIGN TOLL FOR GENERATION OF A NETWORK-ON-CHIP (NoC) | Non-Final OA | ARTERIS, INC. |
| 18226199 | FOCUSED TESTING AND VERIFICATION OF CIRCUIT DESIGNS USING HARDWARE DESCRIPTION LANGUAGE SIMULATION | Non-Final OA | Western Digital Technologies, Inc. |
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