Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2855 2858
This examiner grants 57% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18331699 | MULTI INSTRUMENT EGRESS FOR GAS TURBINE ENGINE | Final Rejection | RTX Corporation |
| 18531279 | POWER EFFICIENT SHOCK DETECTOR | Non-Final OA | Dell Products L.P. |
| 18529782 | INDIVIDUAL DETERMINATION DEVICE AND INDIVIDUAL DETERMINATION METHOD FOR TARGET EQUIPMENT | Final Rejection | MITSUBISHI ELECTRIC CORPORATION |
| 18547549 | SYSTEM AND METHOD FOR B1-SELECTIVE EXCITATION FOR SPATIAL LOCALIZATION IN MAGNETIC RESONANCE IMAGING | Final Rejection | Vanderbilt University |
| 18522489 | CHIP WITH CLOCK MASKING CIRCUIT | Final Rejection | REALTEK SEMICONDUCTOR CORP. |
| 18756002 | SOCKET DOWNSTOP CREEP DETECTION WITH IN-LINE ELECTRICAL MEASUREMENTS | Non-Final OA | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 18431776 | SIMULATING DRIVE VERIFICATION TESTING | Final Rejection | International Business Machines Corporation |
| 18469006 | SEMICONDUCTOR DEVICE AND ULTRASONIC SENSOR | Non-Final OA | ROHM CO., LTD. |
| 18752038 | STRESS CALIBRATION METHOD, CORRESPONDING ELECTRONIC DEVICE | Non-Final OA | STMicroelectronics International N.V. |
| 18616929 | METHOD FOR POSITIONING SEMICONDUCTOR DEVICES AND CORRESPONDING POSITIONING APPARATUS | Final Rejection | STMicroelectronics International N.V. |
| 18583474 | DEVICE AND CIRCUIT FOR MEASURING A DERIVATIVE | Final Rejection | STMicroelectronics International N.V. |
| 18429046 | PLASMA MEASUREMENT METHOD AND PLASMA PROCESSING APPARATUS | Non-Final OA | TOKYO ELECTRON LIMITED |
| 18567476 | OPTICAL SCANNING APPARATUS, ELECTRONIC EQUIPMENT | Final Rejection | STANLEY ELECTRIC CO., LTD. |
| 18523981 | SENSING DEVICE | Non-Final OA | Sitronix Technology Corporation |
| 18457198 | METHOD TO MEASURE CONTACT RESISTANCE AND INSTRUCT USER TO CLEAN CHARGING CONTACTS | Non-Final OA | Oura Health Oy |
| 18706937 | MEASURING ELECTRO-CHEMICAL PROPERTIES OF FLOWABLE MATERIALS | Non-Final OA | UNIVERSITY OF PITTSBURGH - OF THE COMMONWEALTH SYSTEM OF HIGHER EDUCATION |
| 18688534 | Optical Inspection Circuit and Method of Manufacturing an Optical Circuit Chip | Final Rejection | NTT, Inc. |
| 18414564 | MEASUREMENT DEVICE, MEASUREMENT METHOD, AND RECORDING MEDIUM | Final Rejection | CASIO COMPUTER CO., LTD. |
| 18713108 | CHARGED-PARTICLE BEAM APPARATUS FOR VOLTAGE-CONTRAST INSPECTION AND METHODS THEREOF | Non-Final OA | ASML Netherlands B.V. |
| 18510899 | SYSTEMS AND METHODS FOR ESTIMATING OUTPUT CURRENT OF A CHARGE PUMP | Final Rejection | pSemi Corporation |
| 18591341 | CURRENT COMPARATOR USABLE IN DC-DC CONVERTER APPLICATIONS | Final Rejection | NXP B.V. |
| 18705100 | SENSORED BUSHING | Final Rejection | 3M INNOVATIVE PROPERTIES COMPANY |
| 18139428 | SYSTEM AND METHOD FOR DETECTING EXCURSION IN PLASMA PROCESSING | Non-Final OA | HORIBA STEC CO., LTD. |
| 18516453 | LID ANGLE DETECTION | Final Rejection | STMICROELECTRONICS S.r.l. |
| 18340053 | ISOLATED GATE DRIVER WITH A FAULT SIGNAL | Non-Final OA | Allegro MicroSystems, LLC |
| 18167893 | RADIO FREQUENCY CIRCUIT HAVING ERROR DETECTION CAPABILITY | Final Rejection | TMY Technology Inc. |
| 18741054 | Assembly for a sensor | Non-Final OA | Balluff GmbH |
| 18756422 | SYSTEM AND METHOD OF PULSED EDDY CURRENT TESTING | Non-Final OA | Consolidated Edison Company of New York, Inc. |
| 18712607 | CONTACT DEVICE AND ARRANGEMENT AND METHOD FOR CHARACTERIZING SUB-CELLS | Non-Final OA | MEYER BURGER (GERMANY) GMBH |
| 18705867 | MEASURING ASSEMBLIES AND METHOD FOR DETERMINING A MAGNETIC GRADIENT FORCE AND THE DISTRIBUTION THEREOF | Final Rejection | Helmholtz-Zentrum Dresden-Rossendorf e.V. |
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