Listed by the USPTO as RAHIM, NILUFA
Tech Center 2800 • Art Units: 2800 2893
This examiner grants 84% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18442590 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | Final Rejection | Samsung Electronics Co., Ltd. |
| 18390834 | SEMICONDUCTOR PACKAGE | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18541649 | SEMICONDUCTOR PACKAGE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18541630 | INTEGRATED CIRCUIT DEVICE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18475322 | STACKED INTEGRATED CIRCUIT DEVICES INCLUDING STAGGERED GATE STRUCTURES AND METHODS OF FORMING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18112202 | IMAGE SENSOR AND METHOD OF FABRICATING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18102209 | AIRBRIDGE, SUPERCONDUCTING CIRCUIT APPARATUS AND METHOD OF FABRICATION THE SAME | Final Rejection | NEC Corporation |
| 17702593 | TRANSISTOR GATE STACKS WITH THICK HYSTERETIC ELEMENTS | Final Rejection | Intel Corporation |
| 17688495 | INTERCONNECTS WITH SPINTRONIC LOGIC DEVICES | Final Rejection | Intel Corporation |
| 18720889 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME | Non-Final OA | Mitsubishi Electric Corporation |
| 18623839 | HIGH THERMAL CONDUCTIVITY BORON ARSENIDE FOR THERMAL MANAGEMENT, ELECTRONICS, OPTOELECTRONICS, AND PHOTONICS APPLICATIONS | Non-Final OA | The Regents of the University of California |
| 18596514 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | Non-Final OA | Kioxia Corporation |
| 18589300 | SEMICONDUCTOR STORAGE DEVICE AND SEMICONDUCTOR DEVICE | Non-Final OA | Kioxia Corporation |
| 17891655 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE | Non-Final OA | SK hynix Inc. |
| 18579009 | SUBSTRATE FOR SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | Non-Final OA | SHIN-ETSU HANDOTAI CO., LTD. |
| 18171119 | SILICON SUPER JUNCTION STRUCTURES FOR INCREASED THROUGHPUT | Non-Final OA | Applied Materials, Inc. |
| 18521547 | LIGHT DETECTING PIXEL USING VERTICAL GATES AND PLANAR GATES | Non-Final OA | STMICROELECTRONICS INTERNATIONAL N.V. |
| 18782900 | CONDUCTIVE FEATURE FORMATION AND STRUCTURE USING BOTTOM-UP FILLING DEPOSITION | Final Rejection | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18163746 | CFET SRAM WITH BUTT CONNECTION ON ACTIVE AREA | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17114267 | Fin-Like Field Effect Transistors Having High Mobility Strained Channels and Methods of Fabrication Thereof | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18442937 | INTEGRATED PACKAGING DEVICE AND FABRICATION METHODS THEREOF | Final Rejection | Qorvo US, Inc. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy83.6% of resolved applications examined by Nilufa Rahim were allowed (483 resolved cases), compared with 69.7% across Art Unit 2800 over the last five years.
This examiner's interview lift is -1.0 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by Nilufa Rahim took 864 days on average from filing to allowance.
Nilufa Rahim examines applications in Art Unit 2800 in Tech Center 2800 (Semiconductors, Circuits & Optics).
