Prosecution Insights
Last updated: October 01, 2026

Examiner: RAMOS FELICIANO, ELISEO

Tech Center 4100 • Art Units: 2817 2857 2895 4100

This examiner grants 36% of resolved cases

Analysis

Eliseo Ramos Feliciano works in Tech Center 4100 and Art Unit 2817. He has 45 resolved cases with an allowance rate of 35.6 percent. This rate suggests a rigorous examination environment. The median days to allowance is 1102, which is the timeframe for those cases that do reach a grant. These 45 resolved cases provide an initial look at the examiner's standards.

The interview lift is 17.4 percent, providing a strategy for improving the 35.6 percent allowance rate. For the 45 cases resolved, the data suggests that direct communication can help overcome rejections. Practitioners should prepare for a challenging process in Art Unit 2817 and consider the 1102-day median pendency when planning their strategy. The 17.4 percent lift indicates that interviews are a valuable tool for increasing the 35.6 percent baseline probability of success.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

35.6%
Allow Rate
-24.4% vs TC avg
58
Total Applications
+17.4%
Interview Lift
1102
Avg Prosecution Days
Based on 45 resolved cases, 2023–2026

Rejection Statute Breakdown

0.5%
§101 Eligibility
16.4%
§102 Novelty
71.4%
§103 Obviousness
11.3%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18604031 SEMICONDUCTOR DEVICE Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18226568 SEMICONDUCTOR PACKAGES AND METHOD FOR FABRICATING THE SAME Final Rejection Samsung Electronics Co., Ltd.
18451554 Vertical Nano-Pillar Transistor Structures for 3-D ICS Non-Final OA Murata Manufacturing Co., Ltd.
18357085 Backside Contact With Self-Aligned Gate Isolation Non-Final OA INTERNATIONAL BUSINESS MACHINES CORPORATION
18661152 NON-VOLATILE MEMORY CELL WITH SINGLE POLY FLOATING GATE AND CONTACT CONTROL GATE Non-Final OA STMicroelectronics International N.V.
18385036 METHOD OF FABRICATING A CAPACITOR Final Rejection STMicroelectronics International N.V.

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