Tech Center 2800 • Art Units: 1713 1737 2878 2881
This examiner grants 72% of resolved cases
Andrew P. Smyth works in Tech Center 2800 and Art Unit 1713, where they have resolved 867 cases. The examiner has an allowance rate of 71.7 percent, which establishes the baseline probability of success for applications. The median days to allowance is 1037, providing a timeline for the 867 cases that have reached issuance. This 1037-day period is a factor for applicants to consider when planning their prosecution strategy.
The interview lift is 14.5 percent, indicating that interviews are an effective tool for increasing the likelihood of a grant. This 14.5 percent lift is an increase over the 71.7 percent baseline allowance rate. Practitioners should consider the 1037-day median pendency and the positive impact of interviews when planning their prosecution strategy. The data suggests that direct engagement can enhance the 71.7 percent probability of success.
With 867 cases resolved, the 71.7 percent allowance rate and 14.5 percent interview lift are reliable metrics. The 1037-day median timeline to allowance is a key factor for managing expectations. These figures suggest that direct engagement through interviews can improve the 71.7 percent chance of success in Art Unit 1713 and help in refining the approach to the prosecution process.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18825349 | REFLECTANCE CONFOCAL SCANNING ELECTRON MICROSCOPE AND OPERATING METHOD THEREOF | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18113121 | METHOD OF INSPECTING SEMICONDUCTOR DEVICE | Final Rejection | Samsung Electronics Co., Ltd. |
| 18787676 | Optical Apparatus and Charged Particle Beam Apparatus | Non-Final OA | Hitachi High-Tech Corporation |
| 18607593 | LASER DEVICE, COMPUTER-READABLE STORAGE MEDIUM, SYSTEM, AND METHOD | Final Rejection | KAWASAKI JUKOGYO KABUSHIKI KAISHA |
| 18646154 | SUPERCONDUCTING MAGNETIC SHIELD FOR ION TRAP | Non-Final OA | Infineon Technologies Austria AG |
| 18220163 | PLASMA SYSTEM HAVING RESIDENCE TIME TUNING ASSEMBLY | Non-Final OA | Applied Materials, Inc. |
| 18815206 | PARTICLE BEAM THERAPY FACILITY AND PARTICLE BEAM THERAPY DEVICE | Non-Final OA | SUMITOMO HEAVY INDUSTRIES, LTD. |
| 18659571 | ENTANGLED PHOTON LIGHT SOURCE SYSTEMS AND METHODS | Non-Final OA | Purdue Research Foundation |
| 18776534 | LIGHT IRRADIATING APPARATUS | Non-Final OA | HOYA CORPORATION |
| 18631733 | HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOGRAPHY INFORMATION AND METHOD OF MASK INSPECTION | Non-Final OA | Carl Zeiss SMT GmbH |
| 18985754 | IMPLANT PACKAGING CONTAINER | Non-Final OA | Seoul Viosys Co. Ltd. |
| 18174422 | ULTRAVIOLET LIGHT IRRADIATION DEVICE | Non-Final OA | Ushio Denki Kabushiki Kaisha |
| 18698671 | METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE | Non-Final OA | INFINITESIMA LIMITED |
| 18970586 | ION GUIDE GEOMETRY IMPROVEMENTS | Non-Final OA | Thermo Finnigan LLC |
| 18813381 | TEM GRIDS WITH LIQUID SPREADING LANES | Non-Final OA | FEI Company |
| 18731712 | Method and System for Sample Preparation | Non-Final OA | FEI Company |
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