Prosecution Insights
Last updated: October 02, 2026

Examiner: STAFIRA, MICHAEL PATRICK

Tech Center 2800 • Art Units: 2800 2877 2886

This examiner grants 88% of resolved cases

Analysis

Michael Patrick Stafira is a patent examiner in Tech Center 2800 and Art Unit 2800. He has a record of 1288 resolved cases. The examiner maintains an allowance rate of 88.4 percent, which indicates that a majority of applications reach issuance. This percentage suggests that the examination process in this unit frequently results in a grant for the applicant.

The median time to allowance is 694 days. This timeframe provides a clear expectation for the duration of the prosecution cycle, showing that successful applications reach issuance within this median period. This efficiency is a key characteristic of the examiner's historical data and is an important consideration for practitioners managing patent portfolios in Tech Center 2800.

The data also shows an interview lift of 8.8 percent. This metric indicates that the probability of allowance increases when an interview is conducted, even with a base allowance rate of 88.4 percent. With 1288 resolved cases, these figures represent a stable set of outcomes for practitioners. The combination of the allowance rate and the median days to allowance defines the typical experience for applicants in Art Unit 2800.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

88.4%
Allow Rate
+20.4% vs TC avg
1,306
Total Applications
+8.8%
Interview Lift
694
Avg Prosecution Days
Based on 1288 resolved cases, 2023–2026

Rejection Statute Breakdown

3.4%
§101 Eligibility
38.9%
§102 Novelty
44.8%
§103 Obviousness
9.1%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
19061642 OPTICAL APPARATUS, OPTICAL INSPECTION SYSTEM, OBJECT IMAGING METHOD, AND NON-TRANSITORY STORAGE MEDIUM STORING OBJECT IMAGING PROGRAM Non-Final OA KABUSHIKI KAISHA TOSHIBA
19016210 OPTICAL SCANNING APPARATUS, OBJECT DETECTION APPARATUS Non-Final OA STANLEY ELECTRIC CO., LTD.
18970907 METROLOGY FOR ADDITIVE MANUFACTURING Non-Final OA Nikon Corporation
19017328 GUIDANCE FOR INTRAORAL SCANNING Non-Final OA Align Technology, Inc.
18927141 SUPER-RESOLUTION THERMOREFLECTANCE THERMAL MEASUREMENT SYSTEM Non-Final OA The Penn State Research Foundation
19119885 IMAGE ACQUISITION DEVICE, INSPECTION DEVICE, AND IMAGE ACQUISITION METHOD Non-Final OA HAMAMATSU PHOTONICS K.K.
19059762 OPTICAL SYSTEM FOR ENVIRONMENTAL MONITORING Non-Final OA The Charles Stark Draper Laboratory, Inc.
18837416 EXCHANGEABLE SPARK UNIT, SYSTEM AND CALIBRATION METHOD Final Rejection HERAEUS ELECTRO-NITE INTERNATIONAL N.V.
18780568 OPTICAL DISPLACEMENT METER Non-Final OA Keyence Corporation
18675376 INSPECTION SYSTEM FOR BONDING LENSES TO IMAGE SENSORS Non-Final OA ASMPT Singapore Pte. Ltd.

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