Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2111 2112 2815
This examiner grants 87% of resolved cases
Jeffrey Andrew Yang is an examiner in Art Unit 2111 within Tech Center 2800. Based on 39 resolved cases, the examiner has an allowance rate of 87.2%. This rate suggests a high likelihood of success for applications. The interview lift is 24.4%, which indicates a significant increase in the probability of allowance when an interview is held. This 24.4% lift suggests that oral advocacy is a productive strategy for practitioners in this unit.
The median days to allowance for successful cases is 793. This 793-day period serves as a temporal benchmark for applicants navigating the patent process in Tech Center 2800. With 39 resolved cases, the 87.2% allowance rate is a stable indicator of the examiner's disposition. Practitioners should consider the 793-day median pendency alongside the 24.4% interview lift when planning their strategy. The data shows that while the baseline allowance rate is 87.2%, the use of interviews can significantly improve the chances of a positive outcome.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19173625 | Bit Order of NR PBCH Payload to Enhance Polar Code Performance | Non-Final OA | TELEFONAKTIEBOLAGET LM ERICSSON (PUBL) |
| 19172566 | METHODS AND SYSTEMS OF PERFORMING LOW-DENSITY PARITY-CHECK (LDPC) CODING | Non-Final OA | Meta Platforms Technologies, LLC |
| 19071154 | TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME | Non-Final OA | SK hynix Inc. |
| 19202884 | SCAN PACING FOR SCHEDULING OF SCAN OPERATIONS | Non-Final OA | Micron Technology, Inc. |
| 19043647 | LOG LIKELIHOOD RATIO ESTIMATION BASED ON PREVIOUS STAGE OF ERROR HANDLING IN MEMORY DEVICES | Non-Final OA | Micron Technology, Inc. |
| 19036514 | COMMAND ADDRESS FAULT DETECTION USING A PARITY PIN | Final Rejection | Micron Technology, Inc. |
| 18775908 | SOFT METRIC BASED BIT ERROR CORRECTION WITH CRC CODES | Final Rejection | Cypress Semiconductor Corporation |
| 18541240 | DEVICES AND METHODS FOR TESTING DIES WITH OFF-DIE CLOCKS | Non-Final OA | Advanced Micro Devices, Inc. |
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