Prosecution Insights
Last updated: October 04, 2026

MITUTOYO Corporation

Technology areas: Communications • Semiconductors, Circuits & Optics • Medical Devices & Mechanical Engineering

12 pending office actions • 3 art units • 12 examiners • 0 of 12 (0%) have an AI response strategy ready • 64 patents granted in the last 365 days

Portfolio Summary

12
Total Pending OAs
11
Non-Final OAs
1
Final Rejections
0
Advisory / Quayle

Response Deadline Pressure

Based on the USPTO statutory response window for each pending office action. 2 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.

2
Overdue
0
Due this week
0
Due this month
0
Due in next 60 days
0
Due later

Case Difficulty Mix

Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.

9
Hard (75%)
3
Medium (25%)
0
Easy (0%)
0
Unknown (0%)

Rejection Statute Mix

BucketCases
§101 + other3 (25%)
§103 only3 (25%)
Multi-statute (no §101)6 (50%)

Industry Mix

How the docket's pending cases split across USPTO tech-center bands.

0
Life Sciences
0% of docket
0
Information Tech
0% of docket
1
Communications
8% of docket
1
Semiconductors
8% of docket
1
Mechanical / Eng
8% of docket
9
Business / Other
75% of docket

Time-on-OA Estimate

Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.

120 h
Manual time on pending OAs
24 h
Time saved (low, 20%)
42 h
Time saved (mid, 35%)
1.1 wks
FTE-weeks freed (mid)

Top Examiners on this docket

ExaminerApps on this docketAllow rateInterview lift
PEREZ BORROTO, ALFONSO 1 73.5% +19.1%
XING, CHRISTINA ILONA 1 82.9% +17.8%
SCHNASE, PAUL DANIEL 1 69.0% +6.1%
MILLER, JOHN W 1 42.9% +2.1%
YAZBACK, MAHER 1 76.5% +23.9%
WINDSOR, COURTNEY J 1 86.2% +9.3%
VAZ, JANICE EZVI 1 77.0% +18.5%
SHIH, HAOSHIAN 1 69.6% +20.4%
QUINN, DANIEL MICHAEL 1 70.4% +34.7%
FLORES, MARK ANTHONY 1 — —

Hard Cases (9)

Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 8 ordered by deadline are shown.

App #TitleExaminerDue in
19200881 MEASURING INSTRUMENT AND POWER RECEIVING MODULE PEREZ BORROTO, ALFONSO —
18844279 SURFACE SHAPE MEASUREMENT DEVICE XING, CHRISTINA ILONA —
19083053 IMAGE MEASURING APPARATUS AND PROGRAM SCHNASE, PAUL DANIEL —
19012127 METHOD FOR DETERMINING A SURFACE MAP AND IMAGING SYSTEM FOR SAME MILLER, JOHN W —
19012029 METHOD FOR DETERMINING A HEIGHT MAP USING A WHITE LIGHT INTERFEROMETER AND WHITE LIGHT INTERFEROMETER FOR THE SAME YAZBACK, MAHER —
18908877 IMAGE MEASURING APPARATUS AND PROGRAM WINDSOR, COURTNEY J —
18907959 IMAGE MEASURING APPARATUS VAZ, JANICE EZVI —
18895946 CALIBRATION DATA ACQUISITION METHOD AND INSPECTION GAUGE QUINN, DANIEL MICHAEL —

Interview Candidates (6)

Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 6 ordered by deadline are shown.

App #TitleExaminerDue in
19200881 MEASURING INSTRUMENT AND POWER RECEIVING MODULE PEREZ BORROTO, ALFONSO —
18844279 SURFACE SHAPE MEASUREMENT DEVICE XING, CHRISTINA ILONA —
19012029 METHOD FOR DETERMINING A HEIGHT MAP USING A WHITE LIGHT INTERFEROMETER AND WHITE LIGHT INTERFEROMETER FOR THE SAME YAZBACK, MAHER —
18907959 IMAGE MEASURING APPARATUS VAZ, JANICE EZVI —
18899786 MEASUREMENT CONTROL DEVICE SHIH, HAOSHIAN —
18895946 CALIBRATION DATA ACQUISITION METHOD AND INSPECTION GAUGE QUINN, DANIEL MICHAEL —

Top Art Units

Art UnitApps
2836 1
2661 1
3761 1

Pending Office Actions

App #TitleExaminerArt UnitStatutesStatusDue inAIFiled
19200881 MEASURING INSTRUMENT AND POWER RECEIVING MODULE PEREZ BORROTO, ALFONSO 2836 §102§103 Non-Final OA — Pending May 07, 2025
18844279 SURFACE SHAPE MEASUREMENT DEVICE XING, CHRISTINA ILONA — §102§103 Non-Final OA — Pending Apr 09, 2025
19083053 IMAGE MEASURING APPARATUS AND PROGRAM SCHNASE, PAUL DANIEL — §102§112 Non-Final OA — Pending Mar 18, 2025
19012127 METHOD FOR DETERMINING A SURFACE MAP AND IMAGING SYSTEM FOR SAME MILLER, JOHN W — §102§103 Non-Final OA — Pending Jan 07, 2025
19012029 METHOD FOR DETERMINING A HEIGHT MAP USING A WHITE LIGHT INTERFEROMETER AND WHITE LIGHT INTERFEROMETER FOR THE SAME YAZBACK, MAHER — §101§112 Non-Final OA — Pending Jan 07, 2025
18908877 IMAGE MEASURING APPARATUS AND PROGRAM WINDSOR, COURTNEY J — §101§103§112 Non-Final OA — Pending Oct 08, 2024
18907959 IMAGE MEASURING APPARATUS VAZ, JANICE EZVI — §101§103 Non-Final OA — Pending Oct 07, 2024
18899786 MEASUREMENT CONTROL DEVICE SHIH, HAOSHIAN — §103 Non-Final OA — Pending Sep 27, 2024
18895946 CALIBRATION DATA ACQUISITION METHOD AND INSPECTION GAUGE QUINN, DANIEL MICHAEL — §102§103 Non-Final OA — Pending Sep 25, 2024
18403224 NON-CONTACT PROBE FLORES, MARK ANTHONY — §102§103 Non-Final OA — Pending Jan 03, 2024
18394612 INSPECTION METHOD, INSPECTION APPARATUS, AND INSPECTION PROGRAM FOR DISK-SHAPED GRADUATION PLATE SOFRONIOU, MICHAEL MARIO 2661 §103 Final Rejection 19d overdue Pending Dec 22, 2023
18075979 MANUFACTURING METHOD OF CONDUCTIVE PATTERN WANG, FRANKLIN JEFFERSON 3761 §103 Non-Final OA 29d overdue Pending Dec 06, 2022

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