Tech Center 3600 • Art Units: 1798 2877 2878 2899 3645
This examiner grants 83% of resolved cases
Erin R. Garber examines applications in Tech Center 3600 and Art Unit 1798. She has managed 214 resolved cases, resulting in an allowance rate of 82.7 percent. This 82.7 percent allowance rate indicates a high likelihood of success for applications reaching a final disposition. The volume of 214 resolved cases provides a reliable foundation for evaluating her examination performance.
The interview lift for Garber is 17.7 percent. This 17.7 percent lift suggests that conducting an interview is a beneficial strategy for increasing the probability of allowance compared to cases without an interview. While the 82.7 percent allowance rate is already high, the 17.7 percent lift indicates that direct engagement can help resolve outstanding issues more effectively. Practitioners should consider an interview as a key tactic for advancing prosecution in Art Unit 1798.
The median time to allowance is 929 days. This 929 day duration represents the typical timeframe from filing to patent issuance. Applicants can use this 929 day median to set realistic expectations for their prosecution timeline. With 214 resolved cases, this timing metric offers a clear guide for planning and budgeting.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18756899 | IMAGE SENSOR | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18610413 | IMAGE SENSOR INCLUDING DEVICE ISOLATION STRUCTURE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 19110457 | DISTANCE MEASURING DEVICE | Non-Final OA | Panasonic Intellectual Property Management Co., Ltd. |
| 18874751 | Optical System Having a Filter Carrier | Non-Final OA | Robert Bosch GmbH |
| 19001537 | OPTICAL SENSING DEVICE | Final Rejection | InnoLux Corporation |
| 18946223 | DRYING APPARATUS AND IMAGE FORMING SYSTEM | Non-Final OA | KYOCERA Document Solutions Inc. |
| 19102468 | DETECTION DEVICE | Non-Final OA | NIKON CORPORATION |
| 18862803 | MEASUREMENT DEVICE | Non-Final OA | Sony Group Corporation |
| 18730880 | SIGNAL PROCESSING DEVICE, SENSOR DEVICE, SIGNAL PROCESSING METHOD, AND PROGRAM | Non-Final OA | Sony Interactive Entertainment Inc. |
| 18870812 | PHOTODETECTOR AND PHOTODETECTION DEVICE | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18848066 | IMAGING DEVICE AND ELECTRONIC DEVICE | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18846749 | IMAGING DEVICE AND ELECTRONIC DEVICE | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18580112 | SOLID-STATE IMAGING ELEMENT AND ELECTRONIC EQUIPMENT | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18517486 | OPTICAL METROLOGY FOR A PLURALITY OF PROCESS CHAMBERS | Non-Final OA | Tokyo Electron Limited |
| 19056286 | PHOTO CHAMBER WITH LIGHT SHROUDS | Non-Final OA | Microchip Technology Incorporated |
| 17424882 | AIR PURGE UNIT FOR REMOVING LENS CONTAMINATION | Final Rejection | OMRON Corporation |
| 19207335 | CONTACTLESS BUTTON AND BUTTON | Non-Final OA | DARWIN PRECISIONS CORPORATION |
| 19171005 | METHOD AND CONTROL DEVICE FOR ADJUSTING AND/OR CALIBRATING AND/OR MONITORING THE FOCUS VALUE OF AN OPTICAL DEVICE WITH A ZOOM FUNCTION | Non-Final OA | Carl Zeiss Meditec AG |
| 18116187 | INTERFACE-BASED THIN FILM METROLOGY USING SECOND HARMONIC GENERATION | Final Rejection | KLA Corporation |
| 18302349 | SYSTEM FOR IMAGING SUBSTRATE SURFACE AND RELATED METHOD | Final Rejection | GlobalFoundries U.S. Inc. |
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