Tech Center 2800 • Art Units: 2831 2858 2866
This examiner grants 86% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18494292 | DETERMINATION OF GEOLOGIC PERMEABILITY CORRELATIVE WITH MAGNETIC PERMEABILITY MEASURED IN-SITU | Final Rejection | Saudi Arabian Oil Company |
| 18717106 | BATTERY DATA MANAGEMENT APPARATUS AND OPERATING METHOD THEREOF | Non-Final OA | LG ENERGY SOLUTION, LTD. |
| 18466017 | DISPLAY PANEL INSPECTION DEVICE AND DISPLAY PANEL INSPECTION METHOD USING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18477988 | Radiofrequency Identification (RFID) Based System for Sterilization Process Monitoring | Non-Final OA | Georgia Tech Research Corporation |
| 17952017 | TESTING A SEMICONDUCTOR DEVICE USING X-RAYS | Final Rejection | Intel Corporation |
| 17889483 | CIRCUIT PROVIDING ARTIFICIAL TACTILE NEURON AND APPARATUS FOR PREDICTING DISEASE BASED ON THE SAME | Non-Final OA | KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY |
| 18663893 | MULTIPLE-RANGE CALIBRATION FOR PER-PIN PARAMETRIC MEASUREMENT UNIT | Non-Final OA | Analog Devices, Inc. |
| 18424125 | CABLE FAULT DIAGNOSIS USING RECONSTRUCTED REFLECTION SIGNALS | Non-Final OA | Microchip Technology Incorporated |
| 18644473 | TEST AND/OR MEASUREMENT SYSTEM | Non-Final OA | Rohde & Schwarz GmbH & Co. KG |
| 18636431 | DISTRIBUTED ELECTROMAGNETIC INTERROGATION SYSTEM | Non-Final OA | United States Department of Energy |
| 18777495 | Semiconductor test key structure and test method of semiconductor structure | Non-Final OA | United Semiconductor (Xiamen) Co., Ltd. |
| 18774308 | CARTRIDGE MODULE AND MULTI WAFER BURN-IN TEST DEVICE UTILIZING SAME | Non-Final OA | UNITEST INC |
| 18727347 | PROBE PASSING METHOD AND PROBE | Non-Final OA | JAPAN ELECTRONIC MATERIALS CORPORATION |
| 18709529 | BATTERY SEPARATORS AND METHODS FOR TESTING THE SAME | Non-Final OA | Celgard, LLC |
| 18707004 | SENSOR AND SENSING METHOD | Non-Final OA | Adrian LANDMAN |
| 18324938 | SOLID STATE SENSOR | Non-Final OA | Certus Critical Care, Inc. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy