Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2812 2884
This examiner grants 78% of resolved cases
Djura Malevic is an examiner in Tech Center 2800, Art Unit 2812. The examiner has 827 resolved cases. The allowance rate is 78.0 percent, which indicates a very positive environment for applicants. This 78.0 percent rate suggests that the vast majority of applications result in a patent grant.
The interview lift is 9.5 percent. This figure shows that while the allowance rate is already high, an interview can still provide a modest benefit. The median days to allowance is 986 days. This 986-day timeline is the typical duration for successful applications to reach allowance in Art Unit 2812.
Practitioners should note the 827 resolved cases and 78.0 percent allowance rate when planning their approach. The 9.5 percent interview lift is a useful data point for deciding whether to request an interview. The 986 days median pendency provides a benchmark for the expected time to grant with this examiner.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18874727 | FIELD EMISSION DEVICE, AND X-RAY GENERATION DEVICE USING SAME | Non-Final OA | LG ELECTRONICS INC. |
| 18974787 | IMAGING JIG AND INFORMATION PROCESSING APPARATUS | Non-Final OA | FUJIFILM CORPORATION |
| 18761385 | PET APPARATUS AND CALIBRATION METHOD | Final Rejection | CANON KABUSHIKI KAISHA |
| 18742090 | X-RAY DIAGNOSTIC APPARATUS AND CONTROL METHOD FOR X-RAY DIAGNOSTIC APPARATUS | Final Rejection | CANON KABUSHIKI KAISHA |
| 18561042 | PET IMAGING SYSTEM MOUNTING FRAME | Non-Final OA | KONINKLIJKE PHILIPS N.V. |
| 18795148 | INTEGRATED CIRCUIT PACKAGE WITH ELECTRO-OPTICAL INTERCONNECT CIRCUITRY | Final Rejection | Altera Corporation |
| 18722356 | Apparatus for Identifying Object | Final Rejection | LG Energy Solution, Ltd. |
| 19171495 | RADIOGRAPHIC IMAGING APPARATUS | Non-Final OA | Konica Minolta, Inc. |
| 18762173 | PHOTOMETRIC APPARATUS, CALIBRATION SYSTEM, CALIBRATION METHOD, AND NON-TRANSITORY RECORDING MEDIUM | Final Rejection | Konica Minolta, Inc. |
| 19042616 | LOW COST, ROBUST AND HIGH SENSITIVITY ION-CONDUCTING POLYCRYSTALLINE RADIATION DETECTORS | Non-Final OA | Massachusetts Institute of Technology |
| 18848208 | Analysis System, Analysis Method, and Analysis Program | Final Rejection | Hitachi High-Tech Corporation |
| 18862246 | RADIATION DETECTION DEVICE, INFORMATION PROCESSING METHOD AND RECORDING MEDIUM | Non-Final OA | HORIBA, LTD. |
| 18646605 | Coatings for Increasing Near-Infrared Detection Distances | Final Rejection | PPG INDUSTRIES OHIO, INC. |
| 18528351 | PREPARATION METHOD FOR PEROVSKITE THICK FILM AND RADIATION DETECTOR COMPRISING PEROVSKITE THICK FILM | Non-Final OA | Industrial Technology Research Institute |
| 18741873 | OPTICAL GAS SENSOR DEVICE, GAS SENSING METHOD AND STORAGE MEDIUM | Final Rejection | MITSUMI ELECTRIC CO., LTD. |
| 18756439 | METROLOGY METHOD OF CALIBRATING AND MONITORING RADIATION IN EUV LITHOGRAPHIC SYSTEMS | Non-Final OA | KLA Corporation |
| 18879690 | AUTONOMOUS INSPECTION SYSTEM HAVING INSPECTION REGION | Non-Final OA | NUCTECH COMPANY LIMITED |
| 18580987 | SOLID PHANTOM DEVICE FOR BEAM SCANNING | Non-Final OA | The University of Toledo |
| 18385047 | GEL IMAGING DEVICES | Non-Final OA | Life Technologies Holdings PTE Limited |
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