Listed by the USPTO as VALENZUELA, PATRICIA D
Tech Center 2800 • Art Units: 2812 2815 2819 2892
This examiner grants 90% of resolved cases
VALENZUELA, PATRICIA D has 725 resolved cases in tech center 2800 and art unit 2812. The allowance rate is 90.3%, the interview lift is 2.0%, and the median time to allowance is 810 days. The allowance outcome is strong across the recorded matters, while the interview association is minimal. The median indicates that favorable results may still require a prosecution period extending beyond two years.
The principal companies are Taiwan Semiconductor Manufacturing Company, Ltd., Samsung Electronics Co., Ltd., and Intel Corporation. The leading firms are DORITY & MANNING, P.A., BIRCH STEWART KOLASCH & BIRCH, LLP, and JCIPRNET. Applicants may focus on precise claim presentation and efficient written responses, using interviews for targeted clarification rather than relying on a substantial interview effect.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18801963 | SEMICONDUCTOR PACKAGE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18611841 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME | Final Rejection | Samsung Electronics Co., Ltd. |
| 18597506 | DISPLAY DEVICE HAVING PERPENDICULAR ELECTRODE STRUCTURE AND METHOD OF MANUFACTURING THE DISPLAY DEVICE | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18521629 | CAPACITOR AND SEMICONDUCTOR DEVICE INCLUDING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18454110 | IMAGE SENSOR | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18589737 | SEMICONDUCTOR MODULE AND HEAT DISSIPATION BASE | Final Rejection | FUJI ELECTRIC CO., LTD. |
| 17977982 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | Non-Final OA | FUJI ELECTRIC CO., LTD. |
| 18448746 | Vertical Transistor Cell Structures Utilizing Topside and Backside Resources | Non-Final OA | Apple Inc. |
| 18523541 | DISPLAY DEVICE | Final Rejection | LG Display Co., Ltd. |
| 18439660 | DISPLAY DEVICE | Non-Final OA | Samsung Display Co., LTD. |
| 18412347 | METHOD OF MANUFACTURING DISPLAY DEVICE AND DISPLAY DEVICE | Final Rejection | Samsung Display Co., LTD. |
| 18255385 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18726415 | DISPLAY SUBSTRATE AND MANUFACTURING METHOD THEREFOR, AND DISPLAY DEVICE | Non-Final OA | BOE Technology Group Co., Ltd. |
| 18807193 | TECHNIQUES AND CONFIGURATIONS TO REDUCE TRANSISTOR GATE SHORT DEFECTS | Non-Final OA | Intel Corporation |
| 18438450 | INTEGRATED TOP SIDE POWER DELIVERY THERMAL TECHNOLOGY | Final Rejection | Intel Corporation |
| 17895102 | ELECTRONIC ASSEMBLY HAVING A COOLING FEATURE AND METHODS OF FORMING THEREOF | Final Rejection | Intel Corporation |
| 17891727 | INTEGRATED CONFORMAL THERMAL HEAT SPREADER FOR MULTICHIP COMPOSITE DEVICES | Non-Final OA | Intel Corporation |
| 17855145 | MULTIPLE COMPOSITION THERMAL INTERFACE MATERIALS FOR MULTI-DIE PACKAGES | Final Rejection | Intel Corporation |
| 18583026 | SEMICONDUCTOR DEVICE | Final Rejection | SUMITOMO ELECTRIC INDUSTRIES, LTD. |
| 18442748 | SEMICONDUCTOR LIGHT-RECEIVING DEVICE | Non-Final OA | Sumitomo Electric Industries, Ltd. |
| 17977810 | OPTICAL SENSOR WITH TSV STRUCTURE | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 18422166 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | Final Rejection | MEDIATEK Inc. |
| 18449941 | METAL INSULATOR METAL CAPACITOR (MIM CAPACITOR) | Final Rejection | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 18351284 | RADIO FREQUENCY DEVICES INCLUDING RADIO FREQUENCY ABSORBENT FEATURES | Non-Final OA | Infineon Technologies AG |
| 18348041 | INTEGRATED CIRCUIT DEVICE EXPOSED DIE PACKAGE STRUCTURE WITH ADHESIVE | Final Rejection | Marvell Asia Pte Ltd |
| 18346674 | SEMICONDUCTOR DIE STACK STRUCTURE | Non-Final OA | SK hynix Inc. |
| 18435703 | THREE-DIMENSIONAL MEMORY DEVICES AND METHODS FOR FORMING THE SAME | Final Rejection | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 18583573 | NITRIDE SEMICONDUCTOR LIGHT-EMITTING ELEMENT | Final Rejection | Nuvoton Technology Corporation Japan |
| 18763791 | Substrate for Semiconductor Fabrication Having Selectively Treated Perimeter and Method of Treating | Non-Final OA | Applied Materials, Inc. |
| 18539493 | METHODS OF MANUFACTURING LOGIC DEVICES AND MEMORY DEVICES | Final Rejection | Applied Materials, Inc. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy90.3% of resolved applications examined by Patricia D Valenzuela were allowed (725 resolved cases), compared with 82.1% across Art Unit 2812 over the last five years.
This examiner's interview lift is +2.0 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by Patricia D Valenzuela took 810 days on average from filing to allowance.
Patricia D Valenzuela examines applications in Art Unit 2812 in Tech Center 2800 (Semiconductors, Circuits & Optics).
