Technology areas: Chemistry & Materials • Semiconductors, Circuits & Optics
11 pending office actions • 3 art units • 11 examiners • 0 of 11 (0%) have an AI response strategy ready • 10 patents granted in the last 365 days
Point Engineering Co., Ltd. currently manages 11 pending office actions within the Semiconductors, Circuits & Optics technology area. These actions are distributed across 11 distinct examiners, which indicates that every pending matter is being handled by a different individual. This high ratio of examiners to actions suggests a broad exposure to different examination styles within the patent office.
The portfolio is organized into 3 distinct art units, showing some technical concentration despite the variety of examiners. YENINAS, STEVEN LEE is the busiest examiner, responsible for 1 busiest examiner pending office action. This means that no examiner dominates the workload, as the 11 pending office actions are spread among the examiners. Practitioners should prepare for a diverse range of feedback across the 3 distinct art units involved in the prosecution process.
Based on the USPTO statutory response window for each pending office action. 2 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §103 only | 7 (64%) |
| §102 only | 2 (18%) |
| Multi-statute (no §101) | 2 (18%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| YENINAS, STEVEN LEE | 1 | 73.5% | +5.4% |
| POTHEN, FEBA | 1 | 81.1% | +11.2% |
| HAWKINS, DOMINIC E | 1 | 86.9% | +12.1% |
| REISNER, NOAM S | 1 | 74.1% | -8.7% |
| NGUYEN, TRUNG Q | 1 | 91.0% | +6.2% |
| NGUYEN, VINH P | 1 | 86.4% | +16.1% |
| PRETLOW, DEMETRIUS R | 1 | 86.4% | +8.5% |
| FLORES JR, DONALD M | 1 | 76.9% | +27.3% |
| MCDONALD, RODNEY GLENN | 1 | 63.6% | +24.4% |
| KHANAL, ARTI | 1 | — | — |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 5 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18764351 | GUIDE MEMBER, INSPECTION DEVICE, AND ELECTRO-CONDUCTIVE CONTACT PIN | NGUYEN, VINH P | 33d |
| 18839870 | ELECTRICALLY CONDUCTIVE CONTACT PIN | POTHEN, FEBA | — |
| 18997184 | ELECTRICALLY CONDUCTIVE CONTACT PIN AND METHOD FOR MANUFACTURING SAME | HAWKINS, DOMINIC E | — |
| 18845428 | ANODIZED FILM STRUCTURE AND INSPECTION DEVICE COMPRISING SAME | NGUYEN, TRUNG Q | — |
| 18274455 | ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND ELECTRO-CONDUCTIVE CONTACT PIN MODULE | PRETLOW, DEMETRIUS R | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 2 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 19092096 | ELECTRICAL CONNECTOR AND TEST DEVICE COMPRISING THE SAME | YENINAS, STEVEN LEE | — |
| 18704378 | SUSCEPTOR | MCDONALD, RODNEY GLENN | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 5 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18712704 | ANODIC OXIDATION FILM STRUCTURE | FLORES JR, DONALD M | 19d |
| 18764351 | GUIDE MEMBER, INSPECTION DEVICE, AND ELECTRO-CONDUCTIVE CONTACT PIN | NGUYEN, VINH P | 33d |
| 18839870 | ELECTRICALLY CONDUCTIVE CONTACT PIN | POTHEN, FEBA | — |
| 18997184 | ELECTRICALLY CONDUCTIVE CONTACT PIN AND METHOD FOR MANUFACTURING SAME | HAWKINS, DOMINIC E | — |
| 18704378 | SUSCEPTOR | MCDONALD, RODNEY GLENN | — |
| Art Unit | Apps |
|---|---|
| 2858 | 4 |
| 1781 | 1 |
| 1746 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19092096 | ELECTRICAL CONNECTOR AND TEST DEVICE COMPRISING THE SAME | YENINAS, STEVEN LEE | — | §102§103§112 | Non-Final OA | — | Pending | Mar 27, 2025 |
| 18839870 | ELECTRICALLY CONDUCTIVE CONTACT PIN | POTHEN, FEBA | — | §103 | Non-Final OA | — | Pending | Mar 04, 2025 |
| 18997184 | ELECTRICALLY CONDUCTIVE CONTACT PIN AND METHOD FOR MANUFACTURING SAME | HAWKINS, DOMINIC E | — | §103 | Non-Final OA | — | Pending | Jan 21, 2025 |
| 18863989 | ELECTRO-CONDUCTIVE CONTACT PIN AND INSPECTION DEVICE INCLUDING SAME | REISNER, NOAM S | — | §103 | Non-Final OA | — | Pending | Nov 07, 2024 |
| 18845428 | ANODIZED FILM STRUCTURE AND INSPECTION DEVICE COMPRISING SAME | NGUYEN, TRUNG Q | 2858 | §103 | Final Rejection | — | Pending | Sep 09, 2024 |
| 18764351 | GUIDE MEMBER, INSPECTION DEVICE, AND ELECTRO-CONDUCTIVE CONTACT PIN | NGUYEN, VINH P | 2858 | §102 | Final Rejection | 33d | Pending | Jul 04, 2024 |
| 18274455 | ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND ELECTRO-CONDUCTIVE CONTACT PIN MODULE | PRETLOW, DEMETRIUS R | 2858 | §103 | Final Rejection | — | Pending | Jun 27, 2024 |
| 18712704 | ANODIC OXIDATION FILM STRUCTURE | FLORES JR, DONALD M | 1781 | §103 | Final Rejection | 19d | Pending | May 23, 2024 |
| 18704378 | SUSCEPTOR | MCDONALD, RODNEY GLENN | — | §103§112 | Non-Final OA | — | Pending | Apr 24, 2024 |
| 18285852 | MEMBRANE-ELECTRODE ASSEMBLY, AND FUEL CELL INCLUDING SAME | KHANAL, ARTI | 1746 | §103 | Non-Final OA | — | Pending | Oct 05, 2023 |
| 18278173 | COMPOSITE MOLD, METAL MOLDED ARTICLE, AND METHOD FOR MANUFACTURING SAME | VELEZ, ROBERTO | 2858 | §102 | Final Rejection | — | Pending | Aug 21, 2023 |
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