Prosecution Insights
Last updated: October 02, 2026

Examiner: CUTLER, ETHAN EDWARD

Tech Center 2800 • Art Units: 2800 2892

This examiner grants 92% of resolved cases

Analysis

Ethan Edward Cutler is an examiner in Tech Center 2800 and Art Unit 2800 with 61 resolved cases. He has an allowance rate of 91.8% and a median of 1267 days to allowance. The interview lift of 11.9% suggests that interviews provide a boost to the 91.8% allowance rate. For the 61 resolved cases, the 1267-day timeline is a factor for applicants to consider.

This 11.9% lift is a tool for navigating the prosecution period in Tech Center 2800. Practitioners should factor the 1267-day duration into their long-term strategies. The 91.8% allowance rate indicates a high frequency of successful outcomes. With 61 resolved cases, these metrics provide a clear picture of his examination style. The combination of the allowance rate and the 11.9% lift offers a path to grant in Art Unit 2800. These figures are the primary benchmarks for his docket.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

91.8%
Allow Rate
+23.8% vs TC avg
82
Total Applications
+11.9%
Interview Lift
1267
Avg Prosecution Days
Based on 61 resolved cases, 2023–2026

Rejection Statute Breakdown

0%
§101 Eligibility
25.6%
§102 Novelty
65.4%
§103 Obviousness
9.0%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18405534 SEMICONDUCTOR PACKAGE Non-Final OA Samsung Electronics Co., Ltd.
18404529 IINTEGRATED CIRCUIT INCLUDING BACKSIDE WIRING AND METHOD OF MANUFACTURING THE INTEGRATED CIRCUIT Non-Final OA Samsung Electronics Co., Ltd.
18389465 INTEGRATED CIRCUIT INCLUDING CELL ARRAY AND BACKSIDE POWER RAIL Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18238644 INSULATED GLASS UNIT WITH TRANSPARENT OLED PANEL AND MOBILITY SYSTEM INCLUDING THE SAME Non-Final OA LG DISPLAY CO., LTD.
18723840 COMPOUND SEMICONDUCTOR SUBSTRATE Non-Final OA NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
18090199 METHOD AND DEVICE FOR OBTAINING COORDINATE OF CONTACT THROUGH-HOLE (CT) IN MEMORY DEVICE Non-Final OA Yangtze Memory Technologies Co., Ltd.
18809258 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Non-Final OA Mitsubishi Electric Corporation
18290895 LIGHTING DEVICE AND VEHICLE LAMP COMPRISING SAME Non-Final OA LG INNOTEK CO., LTD.
18332388 STACKED FETs WITH BACKSIDE ANGLE CUT Non-Final OA International Business Machines Corporation
18594987 SEMICONDUCTOR DEVICE INCLUDING SELECTOR Non-Final OA SK hynix Inc.
18217827 SEMICONDUCTOR DEVICE ASSEMBLIES WITH SCREEN-PRINTED EPOXY SPACERS AND METHODS FOR FORMING THE SAME Non-Final OA Micron Technology, Inc.
18403616 PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18465622 EMBEDDING BARRIER LAYER IN FINE-PITCH BOND STRUCTURES Final Rejection Taiwan Semiconductor Manufacturing Co., Ltd.

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