Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2815
This examiner grants 60% of resolved cases
John Lin is an examiner in Tech Center 2800, Art Unit 2815, with 428 resolved cases. The examiner's allowance rate is 60.0 percent, which provides a baseline for applicants. This 60.0 percent rate indicates that a majority of the 428 cases result in a grant, offering a predictable environment for prosecution in the 2800 tech center. The 60.0 percent figure is a key metric for evaluating success.
The interview lift for this examiner is 8.5 percent. This figure suggests that while interviews have a positive effect, the impact is a specific increase over the 60.0 percent base allowance rate. Practitioners might find that the 8.5 percent lift is a factor to consider when deciding between written arguments and verbal communication. The data from 428 cases shows the relative influence of interviews on the final outcome.
The median days to allowance is 1370 days. This duration represents the time required to secure a patent grant under this examiner's review. With 428 resolved cases, the 1370-day median and 60.0 percent allowance rate are based on a significant volume of data. Applicants can use the 1370-day figure to plan their prosecution timelines and evaluate the necessity of specific interventions in Art Unit 2815.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18088362 | IMAGE SENSOR | Final Rejection | Samsung Electronics Co., Ltd. |
| 17979522 | DETECTION DEVICE | Non-Final OA | Magnolia White Corporation |
| 18128964 | EMBEDDED MULTI-DIE INTERCONNECT BRIDGE WITH IMPROVED POWER DELIVERY | Non-Final OA | Altera Corporation |
| 17716928 | EMBEDDED MULTI-DIE INTERCONNECT BRIDGE WITH IMPROVED POWER DELIVERY | Final Rejection | Altera Corporation |
| 17581751 | EMBEDDED MULTI-DIE INTERCONNECT BRIDGE WITH IMPROVED POWER DELIVERY | Final Rejection | Altera Corporation |
| 18255429 | SOLID-STATE IMAGING DEVICE AND ELECTRONIC DEVICE | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18251630 | IMAGING ELEMENT, IMAGING DEVICE, AND METHOD OF MANUFACTURING IMAGING ELEMENT | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 17561218 | SEMICONDUCTOR MEMORY DEVICE | Final Rejection | SK hynix Inc. |
| 18207327 | RADIATION-DETECTING STRUCTURES AND FABRICATION METHODS THEREOF | Non-Final OA | Rensselaer Polytechnic Institute |
| 18332837 | HIGH VOLTAGE RESISTOR WITH HIGH VOLTAGE JUNCTION TERMINATION | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17858985 | Inner Spacers for Gate-All-Around Semiconductor Devices | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 16525978 | METAL FILAMENT VIAS FOR INTERCONNECT STRUCTURE | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17874366 | SEMICONDUCTOR ARRANGEMENT AND METHOD OF MAKING | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED |
| 18219243 | SEMICONDUCTOR DEVICE HAVING FUNNEL-SHAPED INTERCONNECT AND METHOD OF MANUFACTURING THE SAME | Final Rejection | NANYA TECHNOLOGY CORPORATION |
| 17879981 | METAL STRUCTURE HAVING FUNNEL-SHAPED INTERCONNECT AND METHOD OF MANUFACTURING THE SAME | Final Rejection | NANYA TECHNOLOGY CORPORATION |
| 18136290 | LIGHT EMITTING DEVICE AND METHOD OF MANUFACTURING THE SAME | Final Rejection | Seoul Viosys Co., Ltd. |
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