Prosecution Insights
Last updated: October 02, 2026

Examiner: TOOHEY, RICHARD ORLANDO

Tech Center 3700 • Art Units: 2812 2884 3791

This examiner grants 83% of resolved cases

Analysis

Richard Orlando Toohey is an examiner in Art Unit 2812 of Tech Center 3700. He has 71 resolved cases and an allowance rate of 83.1 percent. This 83.1 percent rate suggests that the examiner is receptive to the arguments presented by applicants. This figure serves as a benchmark for practitioners evaluating their chances of success.

The interview lift is 10.5 percent. This 10.5 percent lift indicates that a personal discussion with Toohey can improve the chances of an application being allowed. Practitioners can use this figure to justify the utility of an interview as a way to further increase the 83.1 percent baseline for the 71 resolved cases assigned to this examiner.

The median days to allowance is 892. This 892-day metric provides an expectation for the duration of the patent prosecution process. With 71 resolved cases and an 83.1 percent allowance rate, the 892-day median offers a view of what to expect when working with Toohey in Tech Center 3700.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

83.1%
Allow Rate
+13.1% vs TC avg
90
Total Applications
+10.5%
Interview Lift
892
Avg Prosecution Days
Based on 71 resolved cases, 2023–2026

Rejection Statute Breakdown

3.6%
§101 Eligibility
27.5%
§102 Novelty
45.6%
§103 Obviousness
20.9%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18887043 RADIATION IMAGE PROCESSING DEVICE, RADIATION IMAGE PROCESSING METHOD, AND RADIATION IMAGE PROCESSING PROGRAM Final Rejection FUJIFILM CORPORATION
18637949 SEMICONDUCTOR APPARATUS, SEMICONDUCTOR APPARATUS MANUFACTURING METHOD, AND X-RAY COMPUTED TOMOGRAPHY APPARATUS Final Rejection Canon Kabushiki Kaisha
18862982 OPTICAL FIBER BASED 3D POSITIONING AND TRACKING OF PATIENT BODY PART DURING X-RAY Non-Final OA KONINKLIJKE PHILIPS N.V.
18998316 IMAGE ACQUISITION DEVICE AND IMAGE ACQUISITION METHOD Non-Final OA HAMAMATSU PHOTONICS K.K.
18725840 RADIATION DETECTOR AND RADIATION DETECTOR ARRAY Non-Final OA HAMAMATSU PHOTONICS K.K.
18924302 THERMAL SENSOR ARRAY DEVICE, METHOD OF MEASURING A TEMPERATURE GRADIENT AND METHOD OF MEASURING A TEMPERATURE Non-Final OA Melexis Technologies NV

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