Prosecution Insights
Prosecution Insights
Tech Center 2100 • Art Units: 2131 2135 2138 2139 2187 2188
This examiner grants 89% of resolved cases
Hashem Farrokh is an examiner in Tech Center 2100 and Art Unit 2131, with 925 resolved cases. His allowance rate of 89.2% indicates a very high success rate for patent applications. The median days to allowance is 828, providing a clear expectation for an efficient prosecution process.
The data shows an interview lift of 2.3%, suggesting that while interviews are beneficial, the 89.2% allowance rate is already exceptionally strong. For practitioners in Art Unit 2131, this 2.3% lift indicates that written advocacy is highly effective. The 925 resolved cases provide a robust dataset for these performance metrics.
With a median days to allowance of 828, Farrokh maintains a fast pace within Tech Center 2100. The combination of a very high allowance rate and a positive interview lift suggests a highly favorable environment for applicants. Practitioners should focus on the quality of their initial filings to maintain the 89.2% success rate.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19210573 | Data Read/Write Method and Related Apparatus | Non-Final OA | Huawei Technologies Co., Ltd. |
| 19237589 | Monitoring And Configuring Storage Systems Using Generative Artificial Intelligence (AI) | Non-Final OA | PURE STORAGE, INC. |
| 19017952 | HARDWARE COHERENCE SIGNALING PROTOCOL | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 18976568 | ZERO LATENCY PREFETCHING IN CACHES | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 19269964 | DETERMINING AVAILABLE RESOURCES FOR STORING DATA | Non-Final OA | Micron Technology, Inc. |
| 19224446 | BAD BLOCK REPLACEMENT BY A MEMORY SYSTEM | Non-Final OA | Micron Technology, Inc. |
| 19178410 | TECHNIQUES FOR MAPPING TABLE SIZE REDUCTION | Non-Final OA | MICRON TECHNOLOGY, INC. |
| 19027352 | STACK MANAGEMENT IN MEMORY SYSTEMS | Final Rejection | Micron Technology, Inc. |
| 18977783 | Logical Memory Devices with Customizable Power Efficiency Level in Servicing a Host Processor over a Compute Express Link Fabric | Final Rejection | Micron Technology, Inc. |
| 18423157 | TECHNIQUES FOR TAGGING DATA BASED ON CHUNK SIZE | Final Rejection | Micron Technology, Inc. |
| 17889648 | MEMORY DEVICE DEFECT MANAGEMENT | Final Rejection | Micron Technology, Inc. |
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