Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2897
This examiner grants 82% of resolved cases
Aaron J. Gray is an examiner in Tech Center 2800, working in Art Unit 2897. He has resolved 521 cases, which provides a solid foundation for analyzing his examination style. The allowance rate for this examiner is 82.3%, indicating a very favorable environment for applicants. Furthermore, the 29.8% interview lift is a strong indicator that direct engagement is a highly effective strategy for securing an allowance.
The median days to allowance for cases under his review is 912. This 912-day timeline is an important metric for managing expectations regarding the duration of the prosecution process in Art Unit 2897. The 29.8% interview lift is particularly noteworthy, as it suggests that interviews can provide a significant boost to the already high 82.3% allowance rate. With 521 resolved cases, the examiner's metrics are well-defined and offer a clear guide for practitioners.
In Tech Center 2800, the 82.3% allowance rate and 912-day median pendency suggest an efficient and generally positive experience for patent applicants. Practitioners should prioritize the 29.8% interview lift as a key strategic tool. By leveraging these metrics, applicants can better navigate the specific requirements and tendencies of Examiner Gray.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18409523 | SEMICONDUCTOR DEVICES | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18409491 | SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18431398 | DISPLAY PANEL | Non-Final OA | Samsung Display Co., LTD. |
| 18398842 | DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | Samsung Display Co., LTD. |
| 18507280 | DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | Samsung Display Co., Ltd. |
| 18322799 | DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 17449975 | INTERLAYER CONNECTION OF STACKED MICROELECTRONIC COMPONENTS | Final Rejection | ADEIA SEMICONDUCTOR BONDING TECHNOLOGIES INC. |
| 18560477 | IMAGE SENSOR | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18257921 | SOLID-STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING THE SAME | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18256590 | PHOTODETECTOR AND ELECTRONIC DEVICE | Final Rejection | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18252583 | SOLID-STATE IMAGING ELEMENT, MANUFACTURING METHOD, AND ELECTRONIC APPARATUS | Final Rejection | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18314559 | INFRARED-RESPONSIVE SENSOR ELEMENT | Final Rejection | Microsoft Technology Licensing, LLC |
| 18424688 | STACK TYPE SEMICONDUCTOR MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 18346043 | IMAGE SENSING DEVICE AND METHOD FOR MANUFACTURING THE SAME | Final Rejection | SK hynix Inc. |
| 18397476 | SEMICONDUCTOR DEVICES WITH THERMOELECTRIC COOLER | Non-Final OA | Texas Instruments Incorporated |
| 18120650 | LDMOS TRANSISTOR AND METHOD OF FORMING THE LDMOS TRANSISTOR WITH IMPROVED RDS*CGD | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 18409584 | MEMS DEVICE HAVING AN IMPROVED CAP AND MANUFACTURING PROCESS THEREOF | Non-Final OA | STMICROELECTRONICS S.r.l. |
| 18599846 | Aluminum Oxide Isolation for Hybrid Bonding | Non-Final OA | Applied Materials, Inc. |
| 18382218 | SEMICONDUCTOR DEVICE STRUCTURE INCLUDING FUSE STRUCTURE EMBEDDED IN SUBSTRATE | Final Rejection | NANYA TECHNOLOGY CORPORATION |
| 18308322 | ELECTROSTATIC DISCHARGE DEVICES | Final Rejection | GlobalFoundries Singapore Pte. Ltd. |
| 18518581 | SEMICONDUCTOR TRANSISTOR WITH PRECISE GEOMETRIES AND RELATED MANUFACTURE METHOD THEREOF | Non-Final OA | Invention And Collaboration Laboratory Pte, Ltd. |
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