Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2897
This examiner grants 82% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18560477 | IMAGE SENSOR | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18257921 | SOLID-STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING THE SAME | Final Rejection | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18252583 | SOLID-STATE IMAGING ELEMENT, MANUFACTURING METHOD, AND ELECTRONIC APPARATUS | Final Rejection | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18358434 | Thin Film Transistor and Manufacturing Method, Memory and Manufacturing Method, and Electronic Device | Non-Final OA | Huawei Technologies Co., Ltd. |
| 18398842 | DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | Samsung Display Co., LTD. |
| 18507280 | DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | Samsung Display Co., Ltd. |
| 18322799 | DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18424688 | STACK TYPE SEMICONDUCTOR MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 18397476 | SEMICONDUCTOR DEVICES WITH THERMOELECTRIC COOLER | Non-Final OA | Texas Instruments Incorporated |
| 18120650 | LDMOS TRANSISTOR AND METHOD OF FORMING THE LDMOS TRANSISTOR WITH IMPROVED RDS*CGD | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 18382218 | SEMICONDUCTOR DEVICE STRUCTURE INCLUDING FUSE STRUCTURE EMBEDDED IN SUBSTRATE | Final Rejection | NANYA TECHNOLOGY CORPORATION |
| 18522119 | SILICON ON INSULATOR DEVICE | Non-Final OA | United Microelectronics Corp. |
| 18223780 | SELF-PROTECTED ELECTROSTATIC DISCHARGE PROTECTION DEVICES | Final Rejection | GlobalFoundries U.S. Inc. |
| 18358603 | CONTINUOUS LONG JOSEPHSON JUNCTION LOGIC GATE SYSTEM | Non-Final OA | NORTHROP GRUMMAN SYSTEMS CORPORATION |
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