Prosecution Insights
Last updated: August 18, 2026

Examiner: KENDALL, BENJAMIN R

Tech Center 2800 • Art Units: 1714 1716 1718 2837 2896

This examiner grants 33% of resolved cases

Performance Statistics

32.9%
Allow Rate
-35.1% vs TC avg
521
Total Applications
+22.8%
Interview Lift
1441
Avg Prosecution Days
Based on 480 resolved cases, 2023–2026

Rejection Statute Breakdown

1.1%
§101 Eligibility
10.1%
§102 Novelty
64.0%
§103 Obviousness
23.1%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18235653 SUBSTRATE PROCESSING APPARATUS Final Rejection SAMSUNG ELECTRONICS CO., LTD.
18447479 SUBSTRATE TREATING APPARATUS AND SUBSTRATE TREATING METHOD USING THE SAME Final Rejection Samsung Electronics Co., Ltd.
18239176 SYSTEM AND APPARATUS FOR A REACTION CHAMBER Final Rejection ASM IP Holding B.V.
18578100 Equipment For Manufacturing Light-Emitting Device Non-Final OA Semiconductor Energy Laboratory Co., Ltd.
18447810 METHOD FOR IMPROVED POLYSILICON ETCH DIMENSIONAL CONTROL Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
18366074 BY-SITE-COMENSATED ETCH BACK FOR LOCAL PLANARIZATION/TOPOGRAPHY ADJUSTMENT Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18975419 RECOMBINATION CHANNELS FOR ANGLE CONTROL OF NEUTRAL REACTIVE SPECIES Final Rejection Applied Materials, Inc.
18366433 CHAMBER COMPONENT FOR IMPROVED CLEANING EFFICIENCY Final Rejection Applied Materials, Inc.
18088417 Metallic Shield For Stable Tape-Frame Substrate Processing Final Rejection Applied Materials, Inc.
18454234 PIPING, SEMICONDUCTOR MANUFACTURING APPARATUS, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE Final Rejection Kioxia Corporation
18581954 SUBSTRATE PROCESSING APPARATUS Final Rejection Tokyo Electron Limited
18383673 CONTROL METHOD OF SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING APPARATUS Non-Final OA Tokyo Electron Limited
18380776 SYSTEMS AND METHODS FOR IMPROVING PLANARITY USING SELECTIVE ATOMIC LAYER ETCHING (ALE) Final Rejection Tokyo Electron Limited
18237409 SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS Final Rejection Tokyo Electron Limited
18231278 SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS Final Rejection Tokyo Electron Limited
18359783 APPARATUS AND METHOD FOR PLASMA PROCESSING Final Rejection Tokyo Electron Limited
18447533 SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM Final Rejection Kokusai Electric Corporation
18617587 RING STRUCTURES AND SYSTEMS FOR USE IN A PLASMA CHAMBER Final Rejection Lam Research Corporation
18013477 ADJUSTABLE GEOMETRY TRIM COIL Non-Final OA Lam Research Corporation
18013429 MOVABLE DISK WITH APERTURE FOR ETCH CONTROL Non-Final OA LAM RESEARCH CORPORATION
18010423 OPTIMIZING EDGE RADICAL FLUX IN A DOWNSTREAM PLASMA CHAMBER Non-Final OA LAM RESEARCH CORPORATION
17927297 ATOMIC LAYER DEPOSITION COATED POWDER COATING FOR PROCESSING CHAMBER COMPONENTS Final Rejection Lam Research Corporation
18097232 ANTENNA MEMBER AND APPARATUS AND METHOD FOR TREATING SUBSTRATE Final Rejection SEMES CO., LTD.
17973985 SUBSTRATE TREATING APPARATUS AND SUBSTRATE TREATING METHOD Final Rejection SEMES CO., LTD.

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