Prosecution Insights
Last updated: April 19, 2026

Examiner: PARKER, JOHN M

Tech Center 2800 • Art Units: 2816 2823 2899

This examiner grants 92% of resolved cases

Performance Statistics

91.8%
Allow Rate
+23.8% vs TC avg
855
Total Applications
+0.9%
Interview Lift
879
Avg Prosecution Days
Based on 831 resolved cases, 2023–2026

Rejection Statute Breakdown

0.4%
§101 Eligibility
37.3%
§102 Novelty
43.5%
§103 Obviousness
14.1%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18332149 FULLY ALIGNED VIA INTEGRATION WITH SELECTIVE CATALYZED VAPOR PHASE GROWN MATERIALS Non-Final OA Samsung Electronics Co., Ltd.
18320013 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES WITHOUT THICKNESS DEVIATION Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
17781013 METHOD FOR FORMING CONDUCTIVE VIA, CONDUCTIVE VIA AND PASSIVE DEVICE Non-Final OA BOE TECHNOLOGY GROUP CO., LTD.
18148231 METAL FILL STRUCTURES FOR ISOLATORS TO MEET METAL DENSITY AND HIGH VOLTAGE ELECTRIC FIELD REQUIREMENTS Final Rejection Texas Instruments Incorporated
18058705 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Final Rejection Mitsubishi Electric Corporation
18134966 POWER MODULE Non-Final OA Kia Corporation
18136970 HYBRID MOLYBDENUM FILL SCHEME FOR LOW RESISTIVITY SEMICONDUCTOR APPLICATIONS Non-Final OA Applied Materials, Inc.
18187738 TOP VIA INTERCONNECT Non-Final OA INTERNATIONAL BUSINESS MACHINES CORPORATION
18357251 CAVITY IN METAL INTERCONNECT STRUCTURE Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18518196 PHYSICAL UNCLONABLE FUNCTIONS WITH COPPER-SILICON OXIDE PROGRAMMABLE METALLIZATION CELLS Non-Final OA ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY
17573461 LOW VIA RESISTANCE INTERCONNECT STRUCTURE Final Rejection QUALCOMM Incorporated
18361622 LEAKAGE REDUCTION METHODS AND STRUCTURES THEREOF Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18135799 METHOD TO REDUCE BENDING OF FEATURES ON A SURFACE OF A SUBSTRATE AND STRUCTURE FORMED USING SAME Non-Final OA ASM IP Holding B.V.
18237510 INTERCONNECTION STRUCTURE AND METHOD FOR MANUFACTURING THE SAME Non-Final OA NANYA TECHNOLOGY CORPORATION
18372712 METAL INTERCONNECT STRUCTURE AND METHOD FOR FABRICATING THE SAME Non-Final OA UNITED MICROELECTRONICS CORP.
18320235 SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAME Non-Final OA CHANGXIN MEMORY TECHNOLOGIES, INC.

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