Prosecution Insights
Prosecution Insights
Tech Center 3600 • Art Units: 2800 2812 2828 2872 2881 2892 3645
This examiner grants 79% of resolved cases
Wyatt A. Stoffa is a patent examiner in Tech Center 3600 and Art Unit 2800. He has a record of 1041 resolved cases. The examiner maintains an allowance rate of 79.4 percent, which indicates that a majority of applications reach issuance. This percentage suggests that the examination process in this unit frequently results in a grant for the applicant.
The median time to allowance is 843 days. This timeframe provides a clear expectation for the duration of the prosecution cycle, showing that successful applications reach issuance within this median period. This efficiency is a key characteristic of the examiner's historical data and is an important consideration for practitioners managing patent portfolios in Tech Center 3600.
The data also shows an interview lift of 22.8 percent. This metric indicates that the probability of allowance increases when an interview is conducted, even with a base allowance rate of 79.4 percent. With 1041 resolved cases, these figures represent a stable set of outcomes for practitioners. The combination of the allowance rate and the median days to allowance defines the typical experience for applicants in Art Unit 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18419816 | COOLANT SUPPLY APPARATUS FOR ROTATING GANTRY, AND PARTICLE BEAM TREATMENT SYSTEM | Non-Final OA | TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION |
| 18195018 | Medical Device Sterilizer and Magnetizer | Final Rejection | Bard Access Systems, Inc. |
| 18856757 | CHARGED PARTICLE BEAM DEVICE AND METHOD FOR OUTPUTTING IMAGE DATA OF INTEREST | Non-Final OA | HITACHI HIGH-TECH CORPORATION |
| 18854644 | CHARGED PARTICLE BEAM DEVICE, OBSERVATION CONDITION SETTING METHOD, AND PROGRAM | Non-Final OA | HITACHI HIGH-TECH CORPORATION |
| 18669862 | ELECTRON BEAM DEVICE INCLUDING SCHOTTKY EMITTER AND METHOD OF OPERATING SCHOTTKY EMITTER | Final Rejection | Hitachi High-Tech Corporation |
| 18288042 | PARTICLE ANALYZING DEVICE, AND PARTICLE ANALYZING METHOD | Non-Final OA | HITACHI HIGH-TECH CORPORATION |
| 17740848 | HYBRID ION SOURCE FOR ALUMINUM ION GENERATION USING A TARGET HOLDER AND ORGANOALUMINIUM COMPOUNDS | Non-Final OA | Applied Materials, Inc. |
| 18900511 | NEUTRON CAPTURE THERAPY APPARATUS | Non-Final OA | SUMITOMO HEAVY INDUSTRIES, LTD. |
| 18285995 | Slow Atomic Beam Generator, Physical Package, Physical Package For Optical Lattice Clock, Physical Package For Atomic Clock, Physical Package For Atomic Interferometer, Physical Package For Quantum Information Processing Device, And Physical Package System | Non-Final OA | RIKEN |
| 18163529 | EXTREME ULTRAVIOLET LIGHT GENERATION APPARATUS AND ELECTRONIC DEVICE MANUFACTURING METHOD | Non-Final OA | Gigaphoton Inc. |
| 18761319 | SOFTWARE, METHODS, AND SYSTEMS FOR DETERMINATION OF A LOCAL FOCUS POINT | Non-Final OA | ASML NETHERLANDS B.V. |
| 18397896 | CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD OF ALIGNING A SAMPLE IN A CHARGED PARTICLE ASSESSMENT SYSTEM | Non-Final OA | ASML Netherlands B.V. |
| 18563841 | MANIPULATION OF CARRIER TRANSPORT BEHAVIOR IN DETECTOR | Final Rejection | ASML Netherlands B.V. |
| 18038206 | SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY | Non-Final OA | ASML Netherlands B.V. |
| 18669215 | MULTI-REFLECTION MASS SPECTROMETER | Non-Final OA | Thermo Fisher Scientific (Bremen) GmbH |
| 18500982 | ENHANCING MASS SPECTROMETER SIGNALS | Final Rejection | Thermo Fisher Scientific (Bremen) GmbH |
| 18228599 | DEVICES AND PROCESSES FOR MASS SPECTROMETRY UTILIZING VIBRATING SHARP-EDGE SPRAY IONIZATION | Final Rejection | West Virginia University Board of Governors on Behalf of West Virginia University |
| 18930438 | FIELD CURVATURE CORRECTOR FOR USE IN MULTI-ELECTRON-BEAM OPTICAL SYSTEM | Non-Final OA | KLA Corporation |
| 18573589 | LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE | Final Rejection | INFINITESIMA LIMITED |
| 18042430 | GRAPHENE GRID, METHOD FOR PRODUCING GRAPHENE GRID, AND METHOD FOR ANALYZING STRUCTURAL ANALYSIS TARGET SUBSTANCE | Non-Final OA | OSAKA UNIVERSITY |
| 18714355 | HIGH THROUGHPUT MASS SPECTRAL DATA GENERATION | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 18685534 | Extending Operational Lifetime of a Mass Spectrometer | Final Rejection | DH Technologies Development Pte. Ltd. |
| 18262852 | SYSTEMS AND METHODS FOR OBTAINING SAMPLES FOR ANALYSIS | Final Rejection | DH Technologies Development Pte. Ltd. |
| 18107942 | CROSSTALK SUPPRESSION WITH LOCAL CONTROLS | Non-Final OA | DUKE UNIVERSITY |
| 18738398 | TEMPORARILY CHANGING THE QUANTIZATION FIELD OF AN ATOMIC OBJECT CONFINEMENT APPARATUS | Final Rejection | Quantinuum LLC |
| 18475479 | OPTICS-INTEGRATED CONFINEMENT APPARATUS SYSTEM | Non-Final OA | Quantinuum LLC |
| 18454523 | QUANTUM SYSTEM COMPRISING METASURFACES COMPRISING TRANSPARENT CONDUCTIVE MATERIAL | Non-Final OA | Quantinuum LLC |
| 17996599 | CALIBRATION OF ANALYTICAL INSTRUMENT | Non-Final OA | Micromass UK Limited |
| 18701598 | HIGH RESOLUTION TIME-OF-FLIGHT MASS SPECTROMETER AND METHODS OF PRODUCING THE SAME | Non-Final OA | Academia Sinica |
| 18743697 | QUANTUM COLLIMATION METHOD FOR ATOMIC BEAM, QUANTUM COLLIMATOR FOR ATOMIC BEAM, ATOMIC INTERFEROMETER, AND ATOMIC GYROSCOPE | Non-Final OA | TOKYO INSTITUTE OF TECHNOLOGY |
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