Prosecution Insights
Last updated: August 18, 2026

Examiner: STOFFA, WYATT A

Tech Center 3600 • Art Units: 2800 2872 2881 2892 3645

This examiner grants 80% of resolved cases

Performance Statistics

79.5%
Allow Rate
+27.5% vs TC avg
1,111
Total Applications
+23.1%
Interview Lift
840
Avg Prosecution Days
Based on 1035 resolved cases, 2023–2026

Rejection Statute Breakdown

2.8%
§101 Eligibility
20.2%
§102 Novelty
38.9%
§103 Obviousness
32.1%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18029736 STORAGE ASSEMBLY HAVING AT LEAST ONE STORAGE COMPARTMENT Non-Final OA MERCEDES-BENZ GROUP AG
18856757 CHARGED PARTICLE BEAM DEVICE AND METHOD FOR OUTPUTTING IMAGE DATA OF INTEREST Non-Final OA HITACHI HIGH-TECH CORPORATION
18854644 CHARGED PARTICLE BEAM DEVICE, OBSERVATION CONDITION SETTING METHOD, AND PROGRAM Non-Final OA HITACHI HIGH-TECH CORPORATION
18669862 ELECTRON BEAM DEVICE INCLUDING SCHOTTKY EMITTER AND METHOD OF OPERATING SCHOTTKY EMITTER Non-Final OA Hitachi High-Tech Corporation
17740848 HYBRID ION SOURCE FOR ALUMINUM ION GENERATION USING A TARGET HOLDER AND ORGANOALUMINIUM COMPOUNDS Non-Final OA Applied Materials, Inc.
18709488 MASS SPECTROMETER AND CONTROL METHOD THEREFOR Final Rejection SHIMADZU CORPORATION
18518273 METHOD AND SYSTEM FOR COMPOUND DETERMINATION BY MASS SPECTROMETRY Non-Final OA SHIMADZU CORPORATION
18900511 NEUTRON CAPTURE THERAPY APPARATUS Non-Final OA SUMITOMO HEAVY INDUSTRIES, LTD.
18930438 FIELD CURVATURE CORRECTOR FOR USE IN MULTI-ELECTRON-BEAM OPTICAL SYSTEM Non-Final OA KLA Corporation
18590930 USE OF MULTIPLE ELECTRON BEAMS FOR HIGH THROUGHPUT INSPECTION Non-Final OA KLA Corporation
17964444 SYSTEM AND METHOD OF VIBRATION AND AUDIBLE NOISE REDUCTION IN A LIDAR RESONATOR Non-Final OA GM GLOBAL TECHNOLOGY OPERATIONS LLC
18397896 CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD OF ALIGNING A SAMPLE IN A CHARGED PARTICLE ASSESSMENT SYSTEM Final Rejection ASML Netherlands B.V.
18563841 MANIPULATION OF CARRIER TRANSPORT BEHAVIOR IN DETECTOR Non-Final OA ASML Netherlands B.V.
18038206 SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY Non-Final OA ASML Netherlands B.V.
18698733 APPARATUS FOR ACCOMMODATING A SOLID SAMPLE MATERIAL Non-Final OA Technische Universität Wien
18685534 Extending Operational Lifetime of a Mass Spectrometer Final Rejection DH Technologies Development Pte. Ltd.
18037582 Method of Performing MS/MS of High Intensity Ion Beams Using a Bandpass Filtering Collision Cell to Enhance Mass Spectrometry Robustness Final Rejection DH Technologies Development Pte. Ltd.
18476964 ADAPTIVE SLICE DEPTH IN SLICE & VIEW WORKFLOW Final Rejection FEI Company

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