Tech Center 3900 • Art Units: 2825 2827 3992
This examiner grants 84% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19009613 | MEMORY DEVICE AND OPERATING METHOD THEREOF | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18641078 | METHOD AND APPARATUS FOR CONFIGURING BANDWIDTH PART IN SIDELINK COMMUNICATION | Final Rejection | Kia Corporation |
| 18201833 | MOBILE COMMUNICATION SYSTEM, BASE STATION AND USER EQUIPMENT | Final Rejection | Mitsubishi Electric Corporation |
| 18793792 | APPARATUS AND METHOD FOR GENERATING A BANDWIDTH EXTENDED SIGNAL FROM A BANDWIDTH LIMITED AUDIO SIGNAL | Non-Final OA | FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V. |
| 18793791 | APPARATUS AND METHOD FOR GENERATING A BANDWIDTH EXTENDED SIGNAL FROM A BANDWIDTH LIMITED AUDIO SIGNAL | Non-Final OA | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. |
| 18793794 | APPARATUS AND METHOD FOR GENERATING A BANDWIDTH EXTENDED SIGNAL FROM A BANDWIDTH LIMITED AUDIO SIGNAL | Non-Final OA | Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V. |
| 19078539 | SEMICONDUCTOR DEVICE | Non-Final OA | Kioxia Corporation |
| 18957174 | SEMICONDUCTOR MEMORY CARD | Non-Final OA | KIOXIA CORPORATION |
| 18977496 | SYSTEMS AND METHODS FOR NON-TARGET RANK OPERATION IN MULTI-RANK MEMORY SYSTEM | Final Rejection | Micron Technology, Inc. |
| 18441962 | ACTIVE MATERIALS FOR REDUCING HOT ELECTRON-INDUCED PUNCH-THROUGH AND RELATED APPARATUSES AND COMPUTING SYSTEMS | Final Rejection | Micron Technology, Inc. |
| 19045904 | MEMORY DEVICES AND METHODS OF MANUFACTURING THEREOF | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18442387 | METHOD AND DEVICE FOR CONTROLLING MEMORY | Non-Final OA | Seoul National University R&DB Foundation |
| 18659875 | OSCILLATOR CALIBRATION FROM OVER-THE AIR SIGNALS | Final Rejection | Wiliot, Ltd. |
| 18858798 | Racetrack Memory Reading Device based on Josephson Diode Effect | Non-Final OA | MAX PLANCK GESELLSCHAFT ZUR FÖRDERUNG DER WISSENSCHAFTEN EV |
| 18582183 | STATIC RANDOM-ACCESS MEMORY AND INTEGRATED CIRCUIT LAYOUT THEREOF | Non-Final OA | Shanghai Huali Integrated Circuit Corporation |
| 17870241 | USER SELECTABLE ERASURE AND DIAGNOSTIC METHOD AND SYSTEM | Final Rejection | BLANCCO TECHNOLOGY GROUP IP OY |
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