Prosecution Insights
Last updated: May 29, 2026

Examiner: HOLLINGTON, JERMELE M

Tech Center 2800 • Art Units: 2829 2858

This examiner grants 86% of resolved cases

Performance Statistics

86.1%
Allow Rate
+18.1% vs TC avg
927
Total Applications
-15.7%
Interview Lift
914
Avg Prosecution Days
Based on 906 resolved cases, 2023–2026

Rejection Statute Breakdown

1.0%
§101 Eligibility
48.3%
§102 Novelty
42.8%
§103 Obviousness
4.1%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18564369 Tab Guide and Tab Guide Device Comprising Tab Guide Non-Final OA LG Energy Solution, Ltd.
18591877 CURRENT SENSOR CIRCUIT WITH DIFFERENCE AMPLIFIER Non-Final OA TEXAS INSTRUMENTS INCORPORATED
18587317 CIRCUIT INPUT/OUTPUT (I/O) TEST SYSTEM Non-Final OA TEXAS INSTRUMENTS INCORPORATED
18532948 UNIFIED BATTERY CELL SENSOR INTEGRATED BATTERY MODULE Non-Final OA HYUNDAI MOBIS CO., LTD.
18657961 INTERFERENCE COMPENSATED CROSS-AXIAL MAGNETOMETER MEASUREMENTS Non-Final OA Schlumberger Technology Corporation
18757593 DISPLAY PANEL AND DISPLAY APPARATUS Non-Final OA Tianma Advanced Display Technology Institute (Xiamen) Co., Ltd.
18619170 SEMICONDUCTOR DEVICE, TEST APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR CHIP Non-Final OA SK hynix Inc.
18730341 BATTERY MANAGEMENT DEVICE AND BATTERY MANAGEMENT PROGRAM Non-Final OA Hitachi High-Tech Corporation
18648833 PERPENDICULAR COIL INTERFERENCE Non-Final OA AZOTEQ HOLDINGS LIMITED
18729819 A MICROFLUIDIC DEVICE FOR DETECTING AND CHARACTERIZING AT LEAST ONE ANALYTE, FOR EXAMPLE A CELL, IN A SAMPLE FLUID Non-Final OA TECHNISCHE UNIVERSITEIT EINDHOVEN
18796350 SUPERCONDUCTING QUANTUM CHIP AND PARAMETER DETERMINATION METHOD THEREFOR Non-Final OA YANGTZE DELTA INDUSTRIAL INNOVATION CENTER OF QUANTUM SCIENCE AND TECHNOLOGY
18297798 RESILIENT CONDUCTIVE BUMP FOR MICROELECTRONIC TESTING Non-Final OA BAE SYSTEMS Information and Electronic Systems Integration Inc.
18637836 MEMBRANE PROBE CARD, METHOD OF MAKING THE SAME AND METHOD OF MAKING TESTED SEMICONDUCTOR CHIP BY USING THE SAME Non-Final OA MPI CORPORATION
18560916 MEASUREMENT APPARATUS AND MEASUREMENT METHOD Non-Final OA Kyoto University
18621496 DEVICE AND METHOD FOR EARLY FAILURE DETECTION OF A MAGNETIC FIELD-SENSITIVE CURRENT SENSOR Non-Final OA Sensitec GmbH
15740358 DISPLAY PANEL AND METHOD OF MANUFACTURING THE SAME Non-Final OA Chongqing HKC Optoelectronics Technology Co., Ltd.

Facing This Examiner?

IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.

Build Your Strategy

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month