Prosecution Insights
Last updated: April 19, 2026

Examiner: HOLLINGTON, JERMELE M

Tech Center 2800 • Art Units: 2829 2858

This examiner grants 86% of resolved cases

Performance Statistics

86.1%
Allow Rate
+18.1% vs TC avg
919
Total Applications
-15.9%
Interview Lift
987
Avg Prosecution Days
Based on 897 resolved cases, 2023–2026

Rejection Statute Breakdown

1.2%
§101 Eligibility
46.2%
§102 Novelty
27.2%
§103 Obviousness
19.0%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18564369 Tab Guide and Tab Guide Device Comprising Tab Guide Non-Final OA LG Energy Solution, Ltd.
18591877 CURRENT SENSOR CIRCUIT WITH DIFFERENCE AMPLIFIER Non-Final OA TEXAS INSTRUMENTS INCORPORATED
18587317 CIRCUIT INPUT/OUTPUT (I/O) TEST SYSTEM Non-Final OA TEXAS INSTRUMENTS INCORPORATED
18717834 PROCESS FOR DIGITAL DIAGNOSIS OF A SYSTEM OF ACTUATORS IN AN AIRCRAFT UNDERGOING MAINTENANCE Non-Final OA SAFRAN NACELLES
18757593 DISPLAY PANEL AND DISPLAY APPARATUS Non-Final OA Tianma Advanced Display Technology Institute (Xiamen) Co., Ltd.
18297798 RESILIENT CONDUCTIVE BUMP FOR MICROELECTRONIC TESTING Non-Final OA BAE SYSTEMS Information and Electronic Systems Integration Inc.
18619170 SEMICONDUCTOR DEVICE, TEST APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR CHIP Non-Final OA SK hynix Inc.
18648833 PERPENDICULAR COIL INTERFERENCE Non-Final OA AZOTEQ HOLDINGS LIMITED
18740848 TEST AND/OR MEASUREMENT INSTRUMENT AND TEST AND/OR MEASUREMENT SYSTEM Non-Final OA Rohde & Schwarz GmbH & Co. KG
18729819 A MICROFLUIDIC DEVICE FOR DETECTING AND CHARACTERIZING AT LEAST ONE ANALYTE, FOR EXAMPLE A CELL, IN A SAMPLE FLUID Non-Final OA TECHNISCHE UNIVERSITEIT EINDHOVEN
18632889 MAGNETOIMPEDANCE SENSOR Non-Final OA Rockwell Collins, Inc.
18796350 SUPERCONDUCTING QUANTUM CHIP AND PARAMETER DETERMINATION METHOD THEREFOR Non-Final OA YANGTZE DELTA INDUSTRIAL INNOVATION CENTER OF QUANTUM SCIENCE AND TECHNOLOGY
18637836 MEMBRANE PROBE CARD, METHOD OF MAKING THE SAME AND METHOD OF MAKING TESTED SEMICONDUCTOR CHIP BY USING THE SAME Non-Final OA MPI CORPORATION
18560916 MEASUREMENT APPARATUS AND MEASUREMENT METHOD Non-Final OA Kyoto University
18575780 MEASURING ARRANGEMENT FOR EXAMINING A LIGHT-EMITTING DIODE ASSEMBLY AND METHOD Non-Final OA ams-OSRAM International GmbH
18621496 DEVICE AND METHOD FOR EARLY FAILURE DETECTION OF A MAGNETIC FIELD-SENSITIVE CURRENT SENSOR Non-Final OA Sensitec GmbH
15740358 DISPLAY PANEL AND METHOD OF MANUFACTURING THE SAME Non-Final OA Chongqing HKC Optoelectronics Technology Co., Ltd.

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