Tech Center 4100 • Art Units: 2825 2827 4100
This examiner grants 90% of resolved cases
Min Huang is an examiner in Tech Center 4100 and Art Unit 2825. The examiner has 844 resolved cases. This large volume of data provides a very reliable foundation for understanding the examiner's habits and the expected results for patent applications.
The allowance rate for this examiner is 90.3 percent. The interview lift is 9.8 percent. These statistics show that the examiner is very likely to grant a patent. The 9.8 percent lift indicates that while the examiner is already highly inclined to allow cases, interviews still provide a modest benefit to the prosecution process compared to the 90.3 percent baseline.
The median days to allowance is 743. This timeline is quite short, suggesting an efficient path to a grant. Practitioners can use the 743-day median to help clients plan their intellectual property timelines. With a 90.3 percent allowance rate and a 9.8 percent interview lift, the data suggests a very positive and efficient prosecution environment for applications assigned to this examiner.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19029930 | MEMORY DEVICE AND OPERATING METHOD THEREOF | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 19072476 | CONFIGURATION OF MEMORY BASED ON SENSOR DATA | Non-Final OA | Google LLC |
| 18984469 | DATA ERASURE VERIFICATION FOR THREE-DIMENSIONAL NON-VOLATILE MEMORY | Non-Final OA | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 19014897 | FEOL AND BEOL-AWARE MEMORY CELL BUILD | Non-Final OA | International Business Machines Corporation |
| 19014901 | CONTROLLER, MEMORY DEVICE, AND STORAGE DEVICE | Non-Final OA | SK hynix Inc. |
| 18912588 | MEMORY AND MEMORY CONTROLLER SUPPORTING COMMAND ADDRESS HALF RATE MODE | Non-Final OA | SK hynix Inc. |
| 19025093 | MEMORY MODULE MULTIPLE PORT BUFFER TECHNIQUES | Non-Final OA | Micron Technology, Inc. |
| 19014001 | INTERFACE FOR REFRESHING NON-VOLATILE MEMORY | Non-Final OA | Micron Technology, Inc. |
| 19011375 | APPARATUSES, SYSTEMS, AND METHODS FOR NON-TARGETED ON-DIE TERMINATION ADJUSTMENT IN POWER DOWN STATE | Non-Final OA | Micron Technology, Inc. |
| 18888626 | METHODS, DEVICES AND SYSTEMS FOR AN IMPROVED MANAGEMENT OF A NON-VOLATILE MEMORY | Final Rejection | Micron Technology, Inc. |
| 18951392 | BIT-CELL ARCHITECTURE BASED IN-MEMORY COMPUTE | Non-Final OA | STMicroelectronics International N.V. |
| 19020305 | MEMORY DEVICE AND METHOD FOR OPERATING THE SAME | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 19046314 | SEQUENCE FOR FIRST FIRE AND FORMING IN CROSS-POINT ARRAYS | Non-Final OA | Sandisk Technologies, Inc. |
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