Prosecution Insights
Last updated: May 29, 2026

Examiner: MARUF, SHEIKH

Tech Center 2800 • Art Units: 2823 2828 2897

This examiner grants 87% of resolved cases

Performance Statistics

86.8%
Allow Rate
+18.8% vs TC avg
580
Total Applications
+10.2%
Interview Lift
806
Avg Prosecution Days
Based on 545 resolved cases, 2023–2026

Rejection Statute Breakdown

0.4%
§101 Eligibility
6.1%
§102 Novelty
89.7%
§103 Obviousness
1.9%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18338125 GALLIUM NITRIDE POWER TRANSISTOR Non-Final OA HUAWEI TECHNOLOGIES CO., LTD.
18352667 Power Semiconductor Device and Method of Producing a Power Semiconductor Device Non-Final OA Infineon Technologies AG
18014286 LIGHT-EMITTING DEVICE Final Rejection SHARP KABUSHIKI KAISHA
17710584 VERTICAL BIT DATA PATHS FOR INTEGRATED CIRCUITS Non-Final OA Intel Corporation
17874985 DEVICES HAVING A TRANSISTOR WITH A MODIFIED CHANNEL REGION Non-Final OA Micron Technology, Inc.
18142600 JUNCTION STRUCTURE ELEMENT AND METHOD OF MANUFACTURING THE SAME Final Rejection RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
18357144 RECONFIGURABLE AMBIPOLAR TRANSISTOR Non-Final OA UIF (University Industry Foundation), Yonsei University
18358966 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18202541 ANTI-FERROELECTRIC MEMORY DEVICE Non-Final OA Taiwan Semiconductor Manufacturing Company LTD
18314811 SEMICONDUCTOR MEMORY STRUCTURE AND METHOD FOR FORMING THE SAME Final Rejection TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
18069411 ELECTRONIC COMPONENT WITH AT LEAST ONE LAYER OF A FERROELECTRIC OR ANTIFERROELECTRIC MATERIAL Non-Final OA Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung E.V.
18263435 PLATING METHOD AND PLATING APPARATUS Non-Final OA Tokyo Electron Limited
18500151 HEAT DISSIPATION STRUCTURE OF ELECTRONIC DEVICE Non-Final OA Delta Electronics, Inc.
18057658 SEMICONDUCTOR DEVICE INCLUDING FERROELECTRIC STRUCTURE HAVING MOIRÉ PATTERN OF TWO-DIMENSIONAL MATERIAL LAYER Final Rejection SK hynix Inc
18378513 SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF, MEMORY SYSTEM Non-Final OA YANGTZE MEMORY TECHNOLOGIES CO., LTD.
18355417 METHOD FOR SYNTHESIZING NOBLE METAL-SEMICONDUCTOR HETEROSTRUCTURES AND PHOTOCATALYTIC SYSTEM FOR SIMULTANEOUSLY PHOTOCATALYTIC CONVERSION OF CARBON DIOXIDE AND MICROPLASTIC INTO CARBON MONOXIDE Non-Final OA City University of Hong Kong
17733118 BIPOLAR JUNCTION TRANSISTOR Non-Final OA GLOBALFOUNDRIES U.S. Inc.
18281445 SEMICONDUCTOR APPARATUS AND FORMING METHOD FOR FERROELECTRIC THIN FILM Non-Final OA TOKYO INSTITUTE OF TECHNOLOGY
18270712 PHOTOELECTRIC DEVICES Final Rejection TCL TECHNOLOGY GROUP CORPORATION
18140669 SYSTEM AND METHOD FOR TWO-DIMENSIONAL ELECTRONIC DEVICES Non-Final OA NOHM DEVICES, INC.

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