Prosecution Insights
Last updated: October 02, 2026

Examiner: MARUF, SHEIKH

Tech Center 4100 • Art Units: 2823 2828 2897 4100

This examiner grants 87% of resolved cases

Analysis

Sheikh Maruf, working in Art Unit 2823, has resolved 567 cases with an allowance rate of 86.8%. This high rate is paired with a median days to allowance of 822. The volume of 567 cases provides a statistically significant look at his practices in Tech Center 4100. The 822-day median pendency is a key metric for applicants seeking patents in this art unit. This 86.8% allowance rate suggests a very favorable environment for patent grants.

The interview lift is 9.2%, showing that verbal communication often aids in reaching an allowance. Given the 86.8% baseline, the lift further improves already favorable odds. Practitioners should consider the 822-day timeline when setting expectations for their clients. The 9.2% lift indicates that the examiner is responsive to direct engagement. With 567 resolved cases, these metrics are well-supported by historical data.

In Art Unit 2823, the 86.8% rate is a strong indicator of success. The 9.2% interview lift provides a tactical option for resolving outstanding issues. Tech Center 4100 applicants can expect a relatively efficient 822-day path to allowance. This profile suggests that Sheikh Maruf is an examiner who consistently reaches resolutions in a timely manner.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

86.8%
Allow Rate
+26.8% vs TC avg
588
Total Applications
+9.2%
Interview Lift
822
Avg Prosecution Days
Based on 567 resolved cases, 2023–2026

Rejection Statute Breakdown

4.2%
§101 Eligibility
13.7%
§102 Novelty
72.4%
§103 Obviousness
7.5%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18168699 SEMICONDUCTOR DEVICE INCLUDING FERROELECTRIC MATERIAL AND ELECTRONIC DEVICE INCLUDING THE SEMICONDUCTOR DEVICE Non-Final OA Samsung Electronics Co., Ltd.
18151021 SEMICONDUCTOR DEVICES AND METHODS FOR FABRICATING THE SAME Non-Final OA Samsung Electronics Co., Ltd.
18293194 DISPLAY PANEL, MANUFACTURING METHOD THEREFOR, AND DISPLAY APPARATUS Non-Final OA BOE TECHNOLOGY GROUP CO., LTD.
18742136 DISPLAY DEVICE Non-Final OA Samsung Display Co., LTD.
18629250 DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF Non-Final OA Samsung Display Co., LTD.
18627247 DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME Non-Final OA Samsung Display Co., LTD.
18357144 RECONFIGURABLE AMBIPOLAR TRANSISTOR Non-Final OA UIF (University Industry Foundation), Yonsei University
18607094 BURIED BUMP STRUCTURE Non-Final OA QUALCOMM Incorporated
18607034 PACKAGE COMPRISING SUBSTRATES, INTEGRATED DEVICES AND A HEAT SINK Non-Final OA QUALCOMM Incorporated
18342112 Integrated Waveguides for Semiconductor Technology Non-Final OA Intel Corporation
17710584 VERTICAL BIT DATA PATHS FOR INTEGRATED CIRCUITS Final Rejection Intel Corporation
18378513 SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF, MEMORY SYSTEM Final Rejection YANGTZE MEMORY TECHNOLOGIES CO., LTD.
18069411 ELECTRONIC COMPONENT WITH AT LEAST ONE LAYER OF A FERROELECTRIC OR ANTIFERROELECTRIC MATERIAL Final Rejection Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung E.V.
18298402 METAL CONTACT CONNECTION THROUGH DIFFUSION BREAK AREA Non-Final OA INTERNATIONAL BUSINESS MACHINES CORPORATION
17954979 TRANSISTORS WITH ENHANCED VIA-TO-BACKSIDE POWER RAIL Final Rejection International Business Machines Corporation
18707925 LIGHT-EMITTING DEVICE Non-Final OA SHARP DISPLAY TECHNOLOGY CORPORATION
18433787 ETCHING METHOD AND MANUFACTURING METHOD OF A SEMICONDUCTOR MEMORY DEVICE Non-Final OA Kioxia Corporation
18326389 FIELD-PLATED RESISTOR Final Rejection TEXAS INSTRUMENTS INCORPORATED
18416783 FERROELECTRIC TUNNEL JUNCTION DEVICES WITH METAL-FE INTERFACE LAYER AND METHODS FOR FORMING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company Limited
18142600 JUNCTION STRUCTURE ELEMENT AND METHOD OF MANUFACTURING THE SAME Non-Final OA RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
18039919 COMPOUND SEMICONDUCTOR DEVICES WITH A CONDUCTIVE COMPONENT TO CONTROL ELECTRICAL CHARACTERISTICS Final Rejection Analog Devices, Inc.
18631140 ADAPTABLE MEMORY SYSTEM WITH MULTIPLE CHIPLETS Non-Final OA Sandisk Technologies, Inc.
18493947 MULTIMODULE PACKAGE FOR MULTILEVEL INVERTER Non-Final OA GM Global Technology Operations LLC
18281445 SEMICONDUCTOR APPARATUS AND FORMING METHOD FOR FERROELECTRIC THIN FILM Final Rejection TOKYO INSTITUTE OF TECHNOLOGY

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