Tech Center 2800 • Art Units: 2111 2112 2117 2896
This examiner grants 90% of resolved cases
Daniel F McMahon works in Art Unit 2111 and Tech Center 2800. He has 1044 resolved cases with an allowance rate of 89.7 percent. The median days to allowance is 786. These statistics describe the prosecution history for this examiner and provide a basis for understanding the application lifecycle.
The interview lift is 2.3 percent. This figure indicates that an interview is associated with an increase in the likelihood of allowance. Practitioners can use this lift to supplement the 89.7 percent rate. The 786 days median pendency provides a timeline for applications that reach a grant. With 1044 resolved cases, the data shows a specific pattern of outcomes. The 2.3 percent lift and the Art Unit 2111 designation are data points for strategy. This profile informs the approach for applications in Tech Center 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18985856 | Reprogrammable Memory Repair | Non-Final OA | Google LLC |
| 18784704 | ARCHITECTURE FOR DETERMINISTIC MEMORY INITIALIZATION FOR AUTOMOTIVE ELECTRONICS | Non-Final OA | QUALCOMM Incorporated |
| 19212375 | MEMORY SYSTEM | Non-Final OA | Kioxia Corporation |
| 18758583 | NON-VOLATILE STORAGE DEVICE OFFLOADING IN A MULTI-DATA NODE ENVIRONMENT | Non-Final OA | Kioxia Corporation |
| 19049202 | SEMICONDUCTOR CHIP OF CORRECTING ALIGNED ERROR AND SEMICONDUCTOR SYSTEM OF CORRECTING ALIGNED ERROR | Non-Final OA | Research & Business Foundation Sungkyunkwan University |
| 19098910 | DATA RECOVERY USING ORDERED DATA REQUESTS | Non-Final OA | Micron Technology, Inc. |
| 19090126 | DATA RECOVERY SYSTEM FOR MEMORY DEVICES | Non-Final OA | Micron Technology, Inc. |
| 18821886 | Reduction of Errors in Data Retrieved from a Memory Device to Apply an Error Correction Code of a Predetermined Code Rate | Non-Final OA | Micron Technology, Inc. |
| 19097656 | COMPONENT DIE VALIDATION BUILT-IN SELF-TEST (VBIST) ENGINE | Non-Final OA | Ampere Computing LLC |
| 19057103 | SEMICONDUCTOR DEVICE AND DATA TRANSFERRING METHOD FOR SEMICONDUCTOR DEVICE | Non-Final OA | Preferred Networks, Inc. |
| 19067999 | BUILT-IN SELF-TEST DEVICE AND ERROR DETECTION METHOD | Non-Final OA | Winbond Electronics Corp. |
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