Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2826 2893
This examiner grants 91% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18765981 | SEMICONDUCTOR DEVICE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18742750 | REACTIVE ION BEAM ETCHING | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18731426 | SEMICONDUCTOR DEVICE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18642910 | TRANSISTOR DEVICE HAVING SEMICONDUCTOR SPACER, AND FABRICATION METHOD THEREOF | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18212916 | LIGHT-EMITTING DISPLAY DEVICE | Non-Final OA | LG DISPLAY CO., LTD. |
| 18600771 | DISPLAY DEVICE AND METHOD OF FABRICATING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18680460 | SEMICONDUCTOR PROCESSING INTEGRATION FOR BIPOLAR JUNCTION TRANSISTOR (BJT) | Non-Final OA | TEXAS INSTRUMENTS INCORPORATED |
| 18767848 | STRUCTURES AND METHODS FOR REDUCING PROCESS CHARGING DAMAGES | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18619605 | BEVEL SEALING SYSTEM AND METHOD OF USING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18761660 | REDUCED UNDERLAYER OXIDATION DURING GAP FILL | Non-Final OA | Applied Materials, Inc. |
| 18660207 | METHOD FOR FABRICATING SEMICONDUCTOR DEVICE | Non-Final OA | UNITED MICROELECTRONICS CORP. |
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