Tech Center 2800 • Art Units: 2800 2814 2829 2893
This examiner grants 69% of resolved cases
Raj R. Gupta is an examiner in Tech Center 2800 and Art Unit 2800. Across 629 resolved cases, the data shows an allowance rate of 68.7 percent. This 68.7 percent figure provides a baseline for practitioners to understand the probability of a grant. The 629 resolved cases offer a statistically significant look at the examiner's historical tendencies in this semiconductor and electronic component center.
The data reveals an interview lift of 13.4 percent. This 13.4 percent lift indicates that an interview is associated with a higher likelihood of allowance compared to the baseline of cases where no interview is conducted. Practitioners may use this metric to evaluate the impact of verbal advocacy. This comparison is a key element of the prosecution strategy for cases in Art Unit 2800.
The median days to allowance for Gupta is 1099. This 1099-day period serves as a benchmark for the expected duration of successful prosecutions. The combination of the 68.7 percent allowance rate and the 13.4 percent interview lift, within the context of Tech Center 2800, helps in setting expectations for both timing and results.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18502545 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18130570 | DISPLAY MODULE AND MANUFACTURING METHOD THEREFOR | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18675213 | LIGHT-EMITTING DIODE DEVICE AND MANUFACTURING METHOD THEREFOR, AND DISPLAY PANEL AND DISPLAY APPARATUS | Non-Final OA | BOE TECHNOLOGY GROUP CO., LTD. |
| 18191192 | LIGHT-EMITTING DEVICE AND MANUFACTURING METHOD OF THE SAME | Non-Final OA | NICHIA CORPORATION |
| 17350384 | BILAYER METAL DICHALCOGENIDES, SYNTHESES THEREOF, AND USES THEREOF | Non-Final OA | Honda Motor Co., Ltd. |
| 18886333 | DETECTION DEVICE | Non-Final OA | Magnolia White Corporation |
| 18246156 | DISPLAY DEVICE, ELECTRONIC DEVICE, AND METHOD OF MANUFACTURING DISPLAY DEVICE | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 17798164 | LIGHT-EMITING ELEMENT | Final Rejection | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18152550 | SEMICONDUCTOR ASSEMBLY WITH SEMICONDUCTOR SWITCHING DEVICE AND CURRENT SENSE UNIT | Non-Final OA | Infineon Technologies AG |
| 17720032 | Integrated Assemblies Having Semiconductor Oxide Channel Material, and Methods of Forming Integrated Assemblies | Non-Final OA | Micron Technology, Inc. |
| 18442381 | HIGH VOLTAGE DEVICE WITH BOOSTED BREAKDOWN VOLTAGE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18362213 | MASK-FREE PROCESS FOR IMPROVING DRAIN TO GATE BREAKDOWN VOLTAGE IN SEMICONDUCTOR DEVICES | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17837312 | HEAT DISSIPATION STRUCTURES FOR INTEGRATED CIRCUIT PACKAGES AND METHODS OF FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18895017 | SEMICONDUCTOR DEVICE | Non-Final OA | ROHM CO., LTD. |
| 17623628 | METHOD FOR MANUFACTURING LIGHT-EMITTING SUBSTRATE AND LIGHT-EMITTING SUBSTRATE | Non-Final OA | Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. |
| 18746063 | MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | Non-Final OA | UNITED MICROELECTRONICS CORP. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
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