Prosecution Insights
Last updated: October 02, 2026

Examiner: GUPTA, RAJ R

Tech Center 2800 • Art Units: 2800 2814 2829 2893

This examiner grants 69% of resolved cases

Analysis

Raj R. Gupta is an examiner in Tech Center 2800 and Art Unit 2800. Across 629 resolved cases, the data shows an allowance rate of 68.7 percent. This 68.7 percent figure provides a baseline for practitioners to understand the probability of a grant. The 629 resolved cases offer a statistically significant look at the examiner's historical tendencies in this semiconductor and electronic component center.

The data reveals an interview lift of 13.4 percent. This 13.4 percent lift indicates that an interview is associated with a higher likelihood of allowance compared to the baseline of cases where no interview is conducted. Practitioners may use this metric to evaluate the impact of verbal advocacy. This comparison is a key element of the prosecution strategy for cases in Art Unit 2800.

The median days to allowance for Gupta is 1099. This 1099-day period serves as a benchmark for the expected duration of successful prosecutions. The combination of the 68.7 percent allowance rate and the 13.4 percent interview lift, within the context of Tech Center 2800, helps in setting expectations for both timing and results.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

68.7%
Allow Rate
+0.7% vs TC avg
646
Total Applications
+13.4%
Interview Lift
1099
Avg Prosecution Days
Based on 629 resolved cases, 2023–2026

Rejection Statute Breakdown

1.6%
§101 Eligibility
22.3%
§102 Novelty
55.1%
§103 Obviousness
16.9%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18502545 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE Non-Final OA Samsung Electronics Co., Ltd.
18130570 DISPLAY MODULE AND MANUFACTURING METHOD THEREFOR Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18675213 LIGHT-EMITTING DIODE DEVICE AND MANUFACTURING METHOD THEREFOR, AND DISPLAY PANEL AND DISPLAY APPARATUS Non-Final OA BOE TECHNOLOGY GROUP CO., LTD.
18191192 LIGHT-EMITTING DEVICE AND MANUFACTURING METHOD OF THE SAME Non-Final OA NICHIA CORPORATION
17350384 BILAYER METAL DICHALCOGENIDES, SYNTHESES THEREOF, AND USES THEREOF Non-Final OA Honda Motor Co., Ltd.
18886333 DETECTION DEVICE Non-Final OA Magnolia White Corporation
18246156 DISPLAY DEVICE, ELECTRONIC DEVICE, AND METHOD OF MANUFACTURING DISPLAY DEVICE Non-Final OA SONY SEMICONDUCTOR SOLUTIONS CORPORATION
17798164 LIGHT-EMITING ELEMENT Final Rejection SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18152550 SEMICONDUCTOR ASSEMBLY WITH SEMICONDUCTOR SWITCHING DEVICE AND CURRENT SENSE UNIT Non-Final OA Infineon Technologies AG
17720032 Integrated Assemblies Having Semiconductor Oxide Channel Material, and Methods of Forming Integrated Assemblies Non-Final OA Micron Technology, Inc.
18442381 HIGH VOLTAGE DEVICE WITH BOOSTED BREAKDOWN VOLTAGE Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18362213 MASK-FREE PROCESS FOR IMPROVING DRAIN TO GATE BREAKDOWN VOLTAGE IN SEMICONDUCTOR DEVICES Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
17837312 HEAT DISSIPATION STRUCTURES FOR INTEGRATED CIRCUIT PACKAGES AND METHODS OF FORMING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18895017 SEMICONDUCTOR DEVICE Non-Final OA ROHM CO., LTD.
17623628 METHOD FOR MANUFACTURING LIGHT-EMITTING SUBSTRATE AND LIGHT-EMITTING SUBSTRATE Non-Final OA Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
18746063 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE Non-Final OA UNITED MICROELECTRONICS CORP.

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