Prosecution Insights
Last updated: October 02, 2026

Examiner: NIX, NORA TAYLOR

Tech Center 4100 • Art Units: 2891 4100

This examiner grants 90% of resolved cases

Analysis

Nora Taylor Nix serves in Tech Center 4100 and Art Unit 2891. The data includes 88 resolved cases and an allowance rate of 89.8%. This 89.8% rate suggests a very favorable environment for applicants seeking a patent grant. The median days to allowance is 1126, which provides a benchmark for the expected duration of successful applications. With 88 resolved cases, the data offers a clear look at the examiner's historical performance.

The interview lift is 9.4%, showing that interviews provide a small additional benefit to the 89.8% baseline allowance rate. Practitioners can use this 9.4% lift to guide their tactical decisions during prosecution. The 1126 median days to allowance helps in managing client expectations regarding the total time to grant. Direct engagement with the examiner remains a useful option as shown by the 9.4% lift. This analysis of Art Unit 2891 is grounded in the 88 resolved cases recorded.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

89.8%
Allow Rate
+29.8% vs TC avg
105
Total Applications
+9.4%
Interview Lift
1126
Avg Prosecution Days
Based on 88 resolved cases, 2023–2026

Rejection Statute Breakdown

0%
§101 Eligibility
26.9%
§102 Novelty
60.7%
§103 Obviousness
12.1%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18345130 SEMICONDUCTOR DEVICES Non-Final OA Samsung Electronics Co., Ltd.
18555039 DISPLAY SUBSTRATE AND DISPLAY DEVICE Final Rejection BOE TECHNOLOGY GROUP CO., LTD.
18395845 DISPLAY PANEL Final Rejection Samsung Display Co., Ltd.
18591188 SEMICONDUCTOR DEVICE Non-Final OA KABUSHIKI KAISHA TOSHIBA
18474859 CHIP ON FILMS AND DISPLAY DEVICES Final Rejection WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
18757013 CONTACT RESISTANCE REDUCTION IN TRANSISTOR DEVICES WITH METALLIZATION ON BOTH SIDES Non-Final OA Intel Corporation
18555043 SOLID-STATE IMAGING APPARATUS AND ELECTRONIC DEVICE Final Rejection SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18539618 TWO-DIMENSIONAL LAYER ASSISTED THREE-DIMENSIONAL TOP VIA INTERCONNECTS Non-Final OA International Business Machines Corporation
18474703 ELECTRONIC COMPONENT PACKAGE HAVING A METAL PLATE STRUCTURE THAT INCLUDES A TAPERED FOOT PORTION Non-Final OA TEXAS INSTRUMENTS INCORPORATED
18419190 SIDEWALL STRUCTURES FOR MEMORY CELLS IN VERTICAL STRUCTURES Non-Final OA Micron Technology, Inc.
18780436 METHOD OF FORMING PACKAGE STRUCTURE Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18771311 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
17504700 Approaches for Fabricating N-Polar AlxGa1-xN Templates for Electronic and Optoelectronic Devices Final Rejection University of South Carolina
17806832 MANUFACTURING METHOD FOR DEVICE CHIP Final Rejection DISCO CORPORATION

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