Tech Center 2800 • Art Units: 2891
This examiner grants 79% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18120038 | SEMICONDUCTOR DEVICES AND DATA STORAGE SYSTEMS INCLUDING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18700199 | DISPLAY DEVICE | Non-Final OA | Sharp Display Technology Corporation |
| 17875647 | SMALLER MODULE BY STACKING | Final Rejection | Avago Technologies International Sales Pte. Limited |
| 17945703 | THREE-DIMENSIONAL MEMORY DEVICE AND METHOD OF FORMING THE SAME | Non-Final OA | Yangtze Memory Technologies Co., Ltd. |
| 17981759 | SEMICONDUCTOR MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 18178522 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18152938 | SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17895377 | SEMICONDUCTOR DEVICE | Non-Final OA | KIOXIA CORPORATION |
| 18196733 | LOW DEFECT SEMICONDUCTOR FORMATION TECHNIQUES | Non-Final OA | Analog Devices, Inc. |
| 17885406 | INTEGRATED CIRCUIT INTERCONNECTION STRUCTURE | Non-Final OA | STMicroelectronics (Crolles 2) SAS |
| 18177138 | MEMORY DEVICE AND METHOD OF FABRICATING THE SAME | Final Rejection | MACRONIX International Co., Ltd. |
| 18008306 | THREE DIMENSIONAL FLASH MEMORY FOR IMPROVING LEAKAGE CURRENT | Non-Final OA | IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) |
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