Tech Center 2800 • Art Units: 2824
This examiner grants 95% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18810861 | NON-VOLATILE MEMORY DEVICE AND PROGRAMMING METHOD | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18791943 | NON-VOLATILE MEMORY DEVICE AND METHOD OF OPERATING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18819528 | MEMORY DEVICE INCLUDING IN-TIER DRIVER CIRCUIT | Non-Final OA | Micron Technology, Inc. |
| 18814164 | SELF-SELECTING MEMORY ARRAY WITH HORIZONTAL ACCESS LINES | Non-Final OA | Micron Technology, Inc. |
| 18781037 | SEMICONDUCTOR DEVICE HAVING DQS COUNTER CIRCUIT | Non-Final OA | MICRON TECHNOLOGY, INC. |
| 18751936 | APPARATUS INCLUDING BTI CONTROLLER | Final Rejection | MICRON TECHNOLOGY, INC. |
| 18770360 | MEMORY DEVICE RELATED TO SIGNAL TRANSMISSION | Non-Final OA | SK hynix Inc. |
| 18675660 | SEMICONDUCTOR CHIP THAT ADJUSTS STROBE SIGNAL DELAY | Non-Final OA | SK hynix Inc. |
| 18675833 | MEMORY DEVICES CONFIGURED TO PERFORM READ OPERATIONS FOR PSEUDO CHANNELS | Non-Final OA | SK hynix Inc. |
| 18665595 | MEMORY INCLUDING SENSE AMPLIFIER AND OPERATION METHOD OF MEMORY | Non-Final OA | SK hynix Inc. |
| 18596939 | SEMICONDUCTOR SYSTEM FOR DETECTING FAIL LOCATION | Final Rejection | SK hynix Inc. |
| 18442866 | SEMICONDUCTOR DEVICES RELATED TO PRECHARGE OPERATION | Final Rejection | SK hynix Inc. |
| 18762155 | SYSTEM, MEMORY DEVICE AND METHOD | Non-Final OA | NATIONAL TSING HUA UNIVERSITY |
| 18357399 | NON-VOLATILE MEMORY WITH HOLE PRE-CHARGE AND ISOLATED SIGNAL LINES | Final Rejection | SanDisk Technologies LLC |
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