Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2183 2812 2824
This examiner grants 80% of resolved cases
Douglas King is a patent examiner in Tech Center 2800, specifically working within Art Unit 2183. This examiner has overseen 746 resolved cases, which provides a substantial statistical foundation for analyzing their historical prosecution patterns. These 746 resolved cases encompass all applications that have reached a final decision under their review in Art Unit 2183 and Tech Center 2800.
The data reveals an allowance rate of 80.2 percent, which reflects the proportion of applications that are successfully granted. The median days to allowance for these cases is 928. This duration of 928 days represents the typical timeline for reaching a favorable outcome. The 80.2 percent allowance rate serves as a primary benchmark for applicants when planning their prosecution strategy.
The interview lift for this examiner is 4.3 percent. This 4.3 percent lift indicates that conducting an interview is associated with a slight increase in the probability of allowance compared to the baseline rate of 80.2 percent. Given the median days to allowance of 928, the 4.3 percent interview lift suggests that while the baseline is strong, direct communication with the examiner remains a useful tool for ensuring a successful grant.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18495210 | FLASH MEMORY AND READ RECOVERY METHOD THEREOF | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18083493 | PROBABILISTIC AND DETERMINISTIC LOGIC DEVICES WITH REDUCED SYMMETRY MATERIALS | Non-Final OA | Intel Corporation |
| 18255346 | NEURAL NETWORK SYSTEM WITH NEURONS INCLUDING CHARGE-TRAP TRANSISTORS AND NEURAL INTEGRATORS AND METHODS THEREFOR | Non-Final OA | The Regents of the University of California |
| 18808560 | VOLTAGE SUPPLY CIRCUITS, THREE-DIMENSIONAL MEMORY DEVICES, PERIPHERAL CIRCUIT, AND METHODS FOR ADJUSTING VOLTAGE SUPPLY CIRCUIT | Non-Final OA | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 18814856 | INTERFACE REGIONS, AND ASSOCIATED DEVICES AND SYSTEMS | Non-Final OA | Lodestar Licensing Group LLC |
| 18928674 | CROSS-TEMPERATURE COMPENSATION BASED ON MEDIA ENDURANCE IN MEMORY DEVICES | Non-Final OA | Micron Technology, Inc. |
| 18830272 | MANAGING COMPENSATION FOR CELL-TO-CELL COUPLING AND LATERAL MIGRATION IN MEMORY DEVICES BASED ON A SENSITIVITY METRIC | Non-Final OA | Micron Technology, Inc. |
| 18810198 | SIMPLIFIED OPERATIONS TO READ MEMORY CELLS COARSELY PROGRAMMED VIA INTERLEAVED TWO-PASS DATA PROGRAMMING TECHNIQUES | Non-Final OA | Micron Technology, Inc. |
| 18732845 | TEMPERATURE-BASED MEMORY MANAGEMENT | Final Rejection | Micron Technology, Inc. |
| 18668021 | ONE-LADDER READ OF MEMORY CELLS COARSELY PROGRAMMED VIA INTERLEAVED TWO-PASS DATA PROGRAMMING TECHNIQUES | Non-Final OA | Micron Technology, Inc. |
| 18657672 | READ DISTURB MITIGATION BASED ON SIGNAL AND NOISE CHARACTERISTICS OF MEMORY CELLS COLLECTED FOR READ CALIBRATION | Non-Final OA | Micron Technology, Inc. |
| 18396186 | MEMORY REFRESH | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18786276 | EMBEDDED BACKSIDE PCRAM DEVICE STRUCTURE | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18389980 | APPARATUS AND METHODS FOR MANAGING SELECTOR DEVICE THRESHOLD VOLTAGE DRIFT | Non-Final OA | Sandisk Technologies, Inc. |
| 18383730 | METHOD FOR ISOLATING FAULTY NAND TEMPERATURE SENSOR | Non-Final OA | SANDISK TECHNOLOGIES, INC. |
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